Sub-mW Cryogenic InP HEMT LNA for Qubit Readout von Zeng, Yin, Stenarson, Jorgen, Sobis, Peter, Wadefalk, Niklas, Grahn, Jan

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Optimization of Channel Structures in InP HEMT Technology for Cryogenic Low-Noise and Low-Power Operation von Cha, Eunjung, Wadefalk, Niklas, Moschetti, Giuseppe, Pourkabirian, Arsalan, Stenarson, Jorgen, Li, Junjie, Kim, Dae-Hyun, Grahn, Jan

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Transient Noise and Gain Characterization for Pulse-Operated LNAs von Zeng, Yin, Stenarson, Jorgen, Sobis, Peter, Grahn, Jan

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Analytical Extraction of a Schottky Diode Model From Broadband S-Parameters von Aik Yean Tang, Drakinskiy, V., Yhland, K., Stenarson, J., Bryllert, T., Stake, J.

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An Oscilloscope Correction Method for Vector-Corrected RF Measurements von Gustafsson, Sebastian, Thorsell, Mattias, Stenarson, Jorgen, Fager, Christian

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Analytic Solution of the Magnetic Field and Inductance in a Coaxial Short Circuit von Hogas, Marcus, Rydler, Karl-Erik, Stenarson, Jorgen, Yhland, Klas

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InP HEMTs for Sub-mW Cryogenic Low-Noise Amplifiers von Cha, Eunjung, Wadefalk, Niklas, Moschetti, Giuseppe, Pourkabirian, Arsalan, Stenarson, Jorgen, Grahn, Jan

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A Reformulation and Stability Study of TRL and LRM Using S -Parameters von Stenarson, J., Yhland, K.

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Single-Flange 2-Port TRL Calibration for Accurate THz S-Parameter Measurements of Waveguide Integrated Circuits von Hanning, Johanna, Stenarson, Jörgen, Yhland, Klas, Sobis, Peter, Bryllert, Tomas, Stake, Jan

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An empirical table-based FET model von Angelov, I., Rorsman, N., Stenarson, J., Garcia, M., Zirath, H.

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Uncertainty Propagation Through Network Parameter Conversions von Stenarson, J., Yhland, K.

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Measurement Uncertainty in Power Splitter Effective Source Match von Yhland, K., Stenarson, J.

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Sensitivity Analysis of TRL Calibration in Waveguide Integrated Membrane Circuits von Stenarson, Jorgen, Thanh Ngoc Thi Do, Huan Zhao, Sobis, Peter J., Aik-Yean Tang, Yhland, Klas, Stake, Jan

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Submillimeter Wave -Parameter Characterization of Integrated Membrane Circuits von Huan Zhao, Aik-Yean Tang, Sobis, P, Bryllert, T, Yhland, K, Stenarson, J, Stake, J

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An in-circuit noncontacting measurement method for S-parameters and power in planar circuits von Stenarson, J., Yhland, K., Wingqvist, C.

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Uncertainty Propagation Through Network Parameter Conversions von Stenarson, Jörgen, Yhland, Klas

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A general parameter-extraction method for transistor noise models von Stenarson, J., Garcia, M., Angelov, I., Zirath, H.

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Cryogenic wide-band ultra-low-noise IF amplifiers operating at ultra-low DC power von Wadefalk, N., Mellberg, A., Angelov, I., Barsky, M.E., Bui, S., Choumas, E., Grundbacher, R.W., Kollberg, E.L., Lai, R., Rorsman, N., Starski, P., Stenarson, J., Streit, D.C., Zirath, H.

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A new extraction method for the two-parameter FET temperature noise model von Garcia, M., Stenarson, J., Yhland, K., Zirath, H., Angelov, I.

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An evaluation of three simple scalable MIM capacitor models von Mellberg, A., Stenarson, J.

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