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  1. 1
    The role of implantation temperature and dose in the control of the microstructure of SIMOX structures

    The role of implantation temperature and dose in the control of the microstructure of SIMOX structures von Reeson, K.J., Robinson, A.K., Hemment, P.L.F., Marsh, C.D., Christensen, K.N., Booker, G.R., Chater, R.J., Kilner, J.A., Harbeke, G., Steigmeir, E.F., Celler, G.K.

    Veröffentlicht in Microelectronic engineering

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  2. 2
    Characterization of InP and related materials by light scattering and photoluminescence

    Characterization of InP and related materials by light scattering and photoluminescence von Steigmeier, E.F., Auderset, H., Epler, J.E.

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