High-stability quartz-crystal microbalance for investigations in surface science von Bouzidi, L., Narine, S. S., Stefanov, K. G., Slavin, A. J.

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Absolute determination of the stoichiometry of ultra-thin oxide films as a function of thickness: antimony oxide on gold von Stefanov, K.G, Narine, S.S, Slavin, A.J

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Electron irradiation of ion-implanted n-type Si-SiO2 structures studied by deep-level transient spectroscopy von KASCHIEVA, S, STEFANOV, K. G, KARPUZOV, D

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Electrical characterization of defects induced by 12 MeV electrons in p—type Si-SiO2 structures von Stefanov, KG, Kaschieva, S, Karpuzov, D

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Electrical characterization of defects induced by 12 MeV electrons in p—type Si-SiO 2 structures von Stefanov, KG, Kaschieva, S, Karpuzov, D

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