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  1. 1
    Managing Basal Plane Dislocations in SiC: Perspective and Prospects

    Managing Basal Plane Dislocations in SiC: Perspective and Prospects von Myers-Ward, Rachael, Gaskill, D. Kurt, Stahlbush, R.S., Mahadik, N.A., Wheeler, Virginia, Nyakiti, Luke O, Eddy, C.R.


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  2. 2
    (Invited) Mitigating Defects within Silicon Carbide Epitaxy

    (Invited) Mitigating Defects within Silicon Carbide Epitaxy von Caldwell, Joshua D., Stahlbush, R.S., Mahadik, N.


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  3. 3
    Mitigating Issues that Impact 4H-SiC Epitaxy for Reliable Power Electronics

    Mitigating Issues that Impact 4H-SiC Epitaxy for Reliable Power Electronics von Gaskill, D. K., Myers-Ward, R.L., Wheeler, V.D., Stahlbush, R.S., Mahadik, N.


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  4. 4
    Managing Basal Plane Dislocations in SiC: Perspective and Prospects

    Managing Basal Plane Dislocations in SiC: Perspective and Prospects von Gaskill, D. Kurt, Myers-Ward, Rachael, Wheeler, Virginia, Stahlbush, R.S., Mahadik, N.A., Imhoff, E.A., Nyakiti, Luke O., Eddy, C.R.


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