Electron emission properties of crystalline diamond and III-nitride surfaces von Nemanich, R.J, Baumann, P.K, Benjamin, M.C, Nam, O.-H, Sowers, A.T, Ward, B.L, Ade, H, Davis, R.F

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Thin films of aluminum nitride and aluminum gallium nitride for cold cathode applications von Sowers, A. T., Christman, J. A., Bremser, M. D., Ward, B. L., Davis, R. F., Nemanich, R. J.

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Phase transformations during microcutting tests on silicon von Tanikella, B. V., Somasekhar, A. H., Sowers, A. T., Nemanich, R. J., Scattergood, R. O.

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Measurement of field emission from nitrogen-doped diamond films von Sowers, A.T, Ward, B.L, English, S.L, Nemanich, R.J

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Imaging electron emission from diamond and III–V nitride surfaces with photo-electron emission microscopy von Nemanich, R.J, English, S.L, Hartman, J.D, Sowers, A.T, Ward, B.L, Ade, H, Davis, R.F

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Comparison of silicon, nickel, and nickel silicide (Ni 3Si) as substrates for epitaxial diamond growth von Tucker, D.A., Seo, D.-K., Whangbo, M.-H., Sivazlian, F.R., Stoner, B.R., Bozeman, S.P., Sowers, A.T., Nemanich, R.J., Glass, J.T.

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Very low temperature growth and doping of Hg-based epilayers and superlattices von Lansari, Y., Yang, Z., Hwang, S., Reed, F.E., Sowers, A.T., Cook, J.W., Schetzina, J.F.

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Field emission induced damage from nitrogen doped diamond films grown by microwave plasma CVD von Sowers, A.T., Ward, B.I., Nemanich, R.J.

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The effect of substitutional nitrogen incorporation on electron emission from CVD diamond von Park, M., Choi, W.B., Schlesser, R., Sowers, A.T., Bergman, L., Nemanich, R.J., Sitar, Z., Hren, J.J., Cuomo, J.J.

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