Effects of excess tellurium and growth parameters on the band gap defect levels in CdxZn1−xTe von Soundararajan, Raji, Lynn, Kelvin G.

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Positron-defect profiling in Cd1-xZnxTe wafers after saw cutting von MCNEIL, Sean P, LYNN, Kelvin G, WEBER, Marc H, SZELES, Csaba, SOUNDARARAJAN, Raji

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Study of defect levels in CdTe using thermoelectric effect spectroscopy von SOUNDARARAJAN, Raji, LYNN, Kelvin G, AWADALLAH, Salah, SZELES, Csaba, WEI, Su-Huai

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Characterization of etch pit formation via the Everson-etching method on CdZnTe crystal surfaces from the bulk to the nanoscale von Teague, Lucile C., Duff, Martine C., Cadieux, James R., Soundararajan, Raji, Shick, Charles R., Lynn, Kelvin G.

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Processing of Mullite-Aluminum Composites von Soundararajan, Raji, Kuhn, Gabe, Atisivan, Raj, Bose, Susmita, Bandyopadhyay, Amit

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Growth and characterization of single-crystal lead magnesium niobate–lead titanate via high-pressure vertical Bridgman method von Soundararajan, Raji, Das, Rabindra Nath, Tjossem, Russ, Bandyopadhyay, Amit, Lynn, Kelvin G., Eisser, Elgin E., Lazaroff, Jerry

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Positron-defect profiling in Cd^sub 1-x^Zn^sub x^Te wafers after saw cutting von McNeil, Sean P, Lynn, Kelvin G, Weber, Marc H, Szeles, Csaba, Soundararajan, Raji

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