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  1. 1
    Hot Hole-Induced Device Degradation by Drain Junction Reverse Current

    Hot Hole-Induced Device Degradation by Drain Junction Reverse Current von Kim, Kwang-Soo, Song, Juneui, Song, Duheon, Choi, Byoungdeog

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  2. 2
    Hot Hole-Induced Device Degradation By Drain Junction Reverse Current

    Hot Hole-Induced Device Degradation By Drain Junction Reverse Current von Kim, Kwang-Soo, Song, Juneui, Song, Duheon, Choi, Byoungdeog


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  3. 3
    SEMICONDUCTOR DEVICES HAVING DIELECTRIC GAPS

    SEMICONDUCTOR DEVICES HAVING DIELECTRIC GAPS von SHIN HYUNCHUL, YU DA-HOON, SONG JUNEUI, YOO HWAN BAE

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