Understanding public engagement on twitter using topic modeling: The 2019 Ridgecrest earthquake case von Ahn, Jisoo, Son, Hyunsang, Chung, Arnold Dongwoo

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From the black box to the glass box: Using unsupervised and supervised learning processes to predict user engagement for the airline companies von Son, Hyunsang, Ahn, Jisoo, Chung, Arnold D., Drumwright, Minette E.

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A good company gone bad von Park, Young Eun, Son, Hyunsang, Yang, Sung-Un, Lee, Jae Kook

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Temporal Certainty and Skippable In-Stream Commercials: Effects of Ad Length, Timer, and Skip-ad Button on Irritation and Skipping Behavior von Jeon, Yongwoog Andrew, Son, Hyunsang, Chung, Arnold D., Drumwright, Minette E.

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A good company gone bad: An examination of corporate social responsibility agenda-building in times of corporate crisis using machine learning techniques von Park, Young Eun, Son, Hyunsang, Yang, Sung-Un, Lee, Jae Kook

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Ad Length and the Presence of the Timer in In-Stream Commercial: An Abstract von Jeon, Yongwoog, Son, Hyunsang, Chung, Arnold D.

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Exposing Underage Consumers to Alcohol Branding in Sport Sponsorship: An Abstract von Scheinbaum, Angeline Close, Son, Hyunsang, Jeon, Yongwoog, Wilcox, Gary, Yoo, Seung Chul

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Excellent Selector Characteristics of Nanoscale VO2 for High-Density Bipolar ReRAM Applications von SON, Myungwoo, LEE, Joonmyoung, PARK, Jubong, SHIN, Jungho, CHOI, Godeuni, JUNG, Seungjae, LEE, Wootae, KIM, Seonghyun, PARK, Sangsu, HWANG, Hyunsang

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Diode-less bilayer oxide (WOx–NbOx) device for cross-point resistive memory applications von Liu, Xinjun, Sadaf, Sharif Md, Son, Myungwoo, Shin, Jungho, Park, Jubong, Lee, Joonmyoung, Park, Sangsu, Hwang, Hyunsang

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A Water-Resistant, Self-Healing Encapsulation Layer for a Stable, Implantable Wireless Antenna von An, Soojung, Lyu, Hyunsang, Seong, Duhwan, Yoon, Hyun, Kim, In Soo, Lee, Hyojin, Shin, Mikyung, Hwang, Keum Cheol, Son, Donghee

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Co-Occurrence of Threshold Switching and Memory Switching in Pt/NbOx/Pt Cells for Crosspoint Memory Applications von XINJUN LIU, SADAF, Sharif Md, SON, Myungwoo, PARK, Jubong, SHIN, Jungho, LEE, Wootae, SEO, Kyungah, LEE, Daeseok, HWANG, Hyunsang

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Highly uniform and reliable resistance switching properties in bilayer WOx/NbOx RRAM devices von Sadaf, Sharif Md, Liu, Xinjun, Son, Myungwoo, Park, Sangsu, Choudhury, Sakeb H., Cha, Euijun, Siddik, Manzar, Shin, Jungho, Hwang, Hyunsang

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Excellent State Stability of Cu/SiC/Pt Programmable Metallization Cells for Nonvolatile Memory Applications von LEE, Wootae, PARK, Jubong, SON, Myungwoo, LEE, Joonmyoung, JUNG, Seungjae, KIM, Seonghyun, PARK, Sangsu, SHIN, Jungho, HWANG, Hyunsang

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Self-Selective Characteristics of Nanoscale VOx Devices for High-Density ReRAM Applications von SON, Myungwoo, XINJUN LIU, HAM, Moon-Ho, HWANG, Hyunsang, SADAF, Sharif Md, LEE, Daeseok, PARK, Sangsu, LEE, Wootae, KIM, Seonghyun, PARK, Jubong, SHIN, Jungho, JUNG, Seungjae

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Highly uniform and reliable resistance switching properties in bilayer WO x /NbO x RRAM devices von Sadaf, Sharif Md, Liu, Xinjun, Son, Myungwoo, Park, Sangsu, Choudhury, Sakeb H., Cha, Euijun, Siddik, Manzar, Shin, Jungho, Hwang, Hyunsang

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MIM-type cell selector for high-density and low-power cross-point memory application von Shin, Jungho, Choi, Godeuni, Woo, Jiyong, Park, Jubong, Park, Sangsu, Lee, Wootae, Kim, Seonghyun, Son, Myungwoo, Hwang, Hyunsang

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Effect of Ge2Sb2Te5 Thermal Barrier on Reset Operations in Filament-Type Resistive Memory von LEE, Wootae, SIDDIK, Manzar, JUNG, Seungjae, PARK, Jubong, KIM, Seonghyun, SHIN, Jungho, LEE, Joonmyoung, PARK, Sangsu, SON, Myungwoo, HWANG, Hyunsang

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Co-Occurrence of Threshold Switching and Memory Switching in \hbox/\hbox/\hbox Cells for Crosspoint Memory Applications von Xinjun Liu, Sadaf, Sharif Md, Myungwoo Son, Jubong Park, Jungho Shin, Wootae Lee, Kyungah Seo, Daeseok Lee, Hyunsang Hwang

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Excellent Selector Characteristics of Nanoscale \hbox for High-Density Bipolar ReRAM Applications von Son, Myungwoo, Lee, Joonmyoung, Park, Jubong, Shin, Jungho, Choi, Godeuni, Jung, Seungjae, Lee, Wootae, Kim, Seonghyun, Park, Sangsu, Hwang, Hyunsang

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Effect of \hbox\hbox\hbox Thermal Barrier on Reset Operations in Filament-Type Resistive Memory von Wootae Lee, Siddik, M., Seungjae Jung, Jubong Park, Seonghyun Kim, Jungho Shin, Joonmyoung Lee, Sangsu Park, Myungwoo Son, Hyunsang Hwang

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