On-chip p-MOSFET dosimetry (CMOS ICs) von Buehler, M.G., Blaes, B.R., Soli, G.A., Tardio, G.R.

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Total dose testing of a CMOS charged particle spectrometer von Hancock, B.R., Soli, G.A.

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CRRES microelectronic test chip orbital data. II von Soli, G.A., Blaes, B.R., Buehler, M.G., Ray, K., Lin, Y.-S.

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CMOS charged particle spectrometers von Soli, G.A., Garrett, H.B., Fossum, E.R.

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Bench-level characterization of a CMOS standard-cell D-latch using alpha-particle sensitive test circuits von Blaes, B.R., Soli, G.A., Buehler, M.G.

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Clementine RRELAX SRAM particle spectrometer von Buehler, M.G., Soli, G.A., Blaes, B.R., Ratliff, J.M., Garrett, H.B.

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Proton-sensitive custom SRAM detector von Soli, G.A., Blaes, B.R., Buehler, M.G.

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Proton irradiation effects on strained Si1-xGex/Si heterostructures von PARK, J. S, LIN, T. L, JONES, E. W, GUNAPALA, S. D, SOLI, G. A, WILSON, B. A

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Single event induced transients in I/O devices: a characterization von Newberry, D.M., Kaye, D.H., Soli, G.A.

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Experimental Evidence for a New Single-Event Upset (SEU) Mode in a CMOS SRAM Obtained from Model Verification von Zoutendyk, J. A., Smith, L. S., Soli, G. A., Lo, R. Y.

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PC based graphic display real-time particle beam uniformity von Huebner, M.A., Malone, C.J., Smith, L.S., Soli, G.A.

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Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM von Zoutendyk, J. A., Smith, L. S., Soli, G. A., Thieberger, P., Wegner, H. E.

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Empirical Modeling of Single-Event Upset (SEU) in NMOS Depletion-Mode-Load Static RAM (SRAM) Chips von Zoutendyk, J. A., Smith, L. S., Soli, G. A., Smith, S. L., Atwood, G. E., Thieberger, P.

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The Single Event Upset (SEU) Response to 590 MeV Protons von Nichols, D. K., Price, W. E., Smith, L. S., Soli, G. A.

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Latest trends in parts SEP susceptibility from heavy ions von Nichols, D.K., Smith, L.S., Soli, G.A., Koga, R., Kolasinski, W.A.

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A new method for using Cf-252 in SEU testing von Costantine, A., Howard, J. W., Becker, M., Block, R. C., Smith, L. S., Soli, G. A., Stauber, M. C.

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Test SRAMs for characterizing alpha particle tracks in CMOS/bulk memories von Buehler, M.G., Blaes, B.R., Soli, G.A.

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On-chip p-MOSFET dosimetry CMOS ICs von Buehler, M G, Blaes, B R, Soli, G A, Tardio, G R

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Proton irradiation effects on strained Si1− x Ge x /Si heterostructures von Park, J. S., Lin, T. L., Jones, E. W., Gunapala, S. D., Soli, G. A., Wilson, B. A.

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Proton-sensitive custoom SRAM detector von SOLI, G. A, BLAES, B. R, BUEHLER, M. G

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