Academic Discussions: An Analysis of Instructional Discourse and an Argument for an Integrative Assessment Framework von Elizabeth, Tracy, Ross Anderson, T. L, Snow, E. H, Selman, Robert Louis

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Characteristics of the Surface-State Charge (Qss) of Thermally Oxidized Silicon von Deal, B. E., Sklar, M., Grove, A. S., Snow, E. H.

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Ion Transport Phenomena in Insulating Films von Snow, E. H., Grove, A. S., Deal, B. E., Sah, C. T.

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Polarization Phenomena and Other Properties of Phosphosilicate Glass Films on Silicon von Snow, E. H., Deal, B. E.

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Surface Effects on Metal-Silicon Contacts von Yu, A. Y. C., Snow, E. H.

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Space-Charge Polarization in Glass Films von Snow, E. H., Dumesnil, M. E.

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Properties of Gold Doped MOS Structures von Cagnina, S. F., Snow, E. H.

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Fowler-Nordheim Tunneling into Thermally Grown SiO2 von Lenzlinger, M., Snow, E. H.

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Simple Physical Model for the Space-Charge Capacitance of Metal-Oxide-Semiconductor Structures von Grove, A. S., Snow, E. H., Deal, B. E., Sah, C. T.

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Ion migration and space-charge polarization in glass films von Snow, E.H.

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Self-scanned digicon: a digital image tube for astronomical spectroscopy von Tull, R G, Choisser, J P, Snow, E H

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Fowler-Nordheim tunneling in SiO2 films von Snow, E.H.

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Observation of Impurity Redistribution During Thermal Oxidation of Silicon Using the MOS Structure von Deal, B. E., Grove, A. S., Snow, E. H., Sah, C. T.

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BARRIER LOWERING AND FIELD PENETRATION AT METAL-DIELECTRIC INTERFACES von Mead, C. A., Snow, E. H., Deal, B. E.

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Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures von Grove, A.S., Deal, B.E., Snow, E.H., Sah, C.T.

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Barrier energies in MOS structures von Snow, E.H., Deal, B.E., Mead, C.A.

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p -Channel Charge-Coupled Devices with Resistive Gate Structure von Kim, Choong-Ki, Snow, E. H.

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Creation of fast surface states by ionizing radiation von Snow, E.H., Grove, A.S., Fitzgerald, D.J.

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Dielectric Loss due to Impurity Cation Migration in α Quartz von Snow, E. H., Gibbs, P.

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Minority carrier injection of metal-silicon contacts von Yu, A.Y.C., Snow, E.H.

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