Investigation of structural and reflective characteristics of short‐period Mo/B4C multilayer X‐ray mirrors von Shaposhnikov, Roman, Polkovnikov, Vladimir, Garakhin, Sergey, Vainer, Yuliy, Chkhalo, Nikolay, Smertin, Ruslan, Durov, Kirill, Glushkov, Egor, Yakunin, Sergey, Borisov, Mikhail

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Study of Interfaces of Mo/Be Multilayer Mirrors Using X‑ray Photoelectron Spectroscopy von Kasatikov, Sergey A, Filatova, Elena O, Sakhonenkov, Sergei S, Gaisin, Aidar U, Polkovnikov, Vladimir N, Smertin, Ruslan M

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Raman scattering studies of Si/B4C periodic multilayer mirrors with an operating wavelength of 13.5 nm von Kumar, Niranjan, Smertin, Ruslan M, Prathibha, B S, Nezhdanov, Aleksey V, Drozdov, Mikhail N, Polkovnikov, Vladimir N, Chkhalo, Nikolay I

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Effect of Insertion of B4C at the Interface Mo/Be Depending on the Film Order von Filatova, Elena O, Sakhonenkov, Sergei S, Kasatikov, Sergey A, Gaisin, Aidar U, Fateeva, Elizaveta S, Smertin, Ruslan M, Polkovnikov, Vladimir N

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Microstructural stability of silicon and beryllium nanofilms in periodic Si/Be multilayer mirrors investigated by Raman scattering spectroscopy von Kumar, Niranjan, Nezhdanov, Aleksey V., Smertin, Ruslan M., Polkovnikov, Vladimir N., Chkhalo, Nikolay I.

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Investigation of nanostructural and electronic properties of silicides intermetallic in Mo/Si interfaces of periodic multilayers and bilayer structures von Kozakov, Alexey T, Kumar, Niranjan, Vlasenko, Valery G, Pankov, Iliya V, Volochaev, Vadim A, Scrjabin, Anton A, Nikolskii, Anatoly V, Nezhdanov, Aleksey V, Smertin, Ruslan M, Polkovnikov, Vladimir N, Chkhalo, Nikolay I

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Stress, reflectance, and stability of Ru/Be multilayer coatings with Mo interlayers near the 11 nm wavelength von Smertin, Ruslan, Chkhalo, Nikolai, Garakhin, Sergey, Polkovnikov, Vladimir, Zuev, Sergey

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Influence of silicon interlayers on the structural and reflective X‐ray characteristics of Ni/Ti multilayer mirrors von Smertin, Ruslan, Antyushin, Evgeny, Malyshev, Ilya, Zorina, Masha, Chkhalo, Nikolai, Yunin, Pavel, Garakhin, Sergey, Polkovnikov, Vladimir, Vainer, Yuliy

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Raman scattering studies of Si/B 4 C periodic multilayer mirrors with an operating wavelength of 13.5 nm von Kumar, Niranjan, Smertin, Ruslan M, Prathibha, B S, Nezhdanov, Aleksey V, Drozdov, Mikhail N, Polkovnikov, Vladimir N, Chkhalo, Nikolay I

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Investigation of structural and reflective characteristics of short-period Mo/B 4 C multilayer X-ray mirrors von Shaposhnikov, Roman, Polkovnikov, Vladimir, Garakhin, Sergey, Vainer, Yuliy, Chkhalo, Nikolay, Smertin, Ruslan, Durov, Kirill, Glushkov, Egor, Yakunin, Sergey, Borisov, Mikhail

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Matrix based algorithm for ion-beam figuring of optical elements von Chernyshev, Aleksei, Chkhalo, Nikolay, Malyshev, Ilya, Mikhailenko, Mikhail, Pestov, Alexey, Pleshkov, Roman, Smertin, Ruslan, Svechnikov, Mikhail, Toropov, Mikhail

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Raman scattering study of nanoscale Mo/Si and Mo/Be periodic multilayer structures von Kumar, Niranjan, Volodin, Vladimir A., Smertin, Ruslan M., Yunin, Pavel A., Polkovnoikov, Vladimir N., Panda, Kalpataru, Nechay, Andrey N., Chkhalo, Nikolay I.

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Effect of Insertion of B 4 C at the Interface Mo/Be Depending on the Film Order von Filatova, Elena O., Sakhonenkov, Sergei S., Kasatikov, Sergey A., Gaisin, Aidar U., Fateeva, Elizaveta S., Smertin, Ruslan M., Polkovnikov, Vladimir N.

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Investigation of transverse optical phonon of thin Si films embedded in periodic Mo/Si and W/Si multilayer mirrors von Kumar, Niranjan, Nezhdanov, Aleksey V., Garakhin, Sergey A., Smertin, Ruslan M., Yunin, Pavel A., Polkovnikov, Vladimir N., Chkhalo, Nikolay I., Mashin, Aleksandr I.

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Interface heterogeneity of periodic multilayer mirrors investigated by X-ray fluorescence, scattering spectroscopy, and mathematical methods of statistics von Mazuritskiy, Mikhail I., Kozakov, Alexey T., Kumar, Niranjan, Smertin, Ruslan M., Garakhin, Sergei A., Polkovnikov, Vladimir N., Chkhalo, Nikolay I.

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