Trends in sputtering von Smentkowski, Vincent S.

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Elemental imaging von Pisonero, J, Bordel, N, Smentkowski, V. S

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A comparison of multivariate statistical analysis protocols for ToF-SIMS spectral images von Smentkowski, V. S., Ostrowski, S. G., Keenan, M. R.

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Matrix Implanted Laser Desorption Ionization (MILDI) Combined with Ion Mobility-Mass Spectrometry for Bio-Surface Analysis von Tempez, A, Ugarov, M, Egan, T, Schultz, J. A, Novikov, A, Della-Negra, S, Lebeyec, Y, Pautrat, M, Caroff, M, Smentkowski, V. S, Wang, H-Y. J, Jackson, S. N, Woods, A. S

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Characterization of dilute species within CVD‐grown silicon nanowires doped using trimethylboron: protected lift‐out specimen preparation for atom probe tomography von PROSA, T. J., ALVIS, R., TSAKALAKOS, L., SMENTKOWSKI, V. S.

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Multivariate Statistical Analysis of Concatenated Time-of-Flight Secondary Ion Mass Spectrometry Spectral Images. Complete Description of the Sample with One Analysis von Smentkowski, V. S, Keenan, M. R, Ohlhausen, J. A. (Tony), Kotula, P. G

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Multivariate Statistical Analysis of Three-Spatial-Dimension TOF-SIMS Raw Data Sets von Smentkowski, V. S, Ostrowski, S. G, Braunstein, E, Keenan, M. R, Ohlhausen, J. A. (Tony), Kotula, P. G

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Effects of Substrate Modification in Wetting of Hydrophobic Materials in ESEM von Castagna, M., Rossi, M., Denault, L., Smentkowski, V.S.

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Atom Probe Tomography Analysis of Grain Boundaries in CdTe von Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Kelly, T.F., Smentkowski, V.S.

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Multivariate statistical analysis of non-mass-selected ToF-SIMS data von Smentkowski, V. S., Ostrowski, S. G., Kollmer, F., Schnieders, A., Keenan, M. R., Ohlhausen, J. A., Kotula, P. G.

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Fluorination of Diamond Surfaces by Irradiation of Perfluorinated Alkyl Iodides von Smentkowski, V. S., Yates, John T.

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New Applications in Atom Probe Tomography von Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Martin, I., Kelly, T.F., Smentkowski, V.S., Gordon, L.M., Joester, D., Inoue, K.

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Preparation of Self-Assembled Monolayers on InP von Gu, Y, Lin, Z, Butera, R. A, Smentkowski, V. S, Waldeck, D. H

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Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate von Smentkowski, V.S., Duong, H.M., Tamaki, R., Keenan, M.R., Ohlhausen, J.A. Tony, Kotula, P.G.

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Reduction of artifacts in temperature programmed desorption measurements of field generated, real-life, powered samples von Smentkowski, V. S., Linsebigler, A. L.

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Interface analysis in CdTe/CdS solar cells von Lita, B, Pavol, M J, Dovidenko, K, Le Tarte, L A, Ellis, D, Barbuto, T, Bansal, S, Smentkowski, V S, Young, M, Asher, S E

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Metal-dielectric interface toughening by molecular nanolayer decomposition von Garg, Saurabh, Jain, Ashutosh, Karthik, C., Singh, Binay, Teki, Ranganath, Smentkowski, V. S., Lane, Michael W., Ramanath, Ganpati

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Deuterium atom interaction with diamond (100) studied by X-ray photoelectron spectroscopy von Smentkowski, V.S, Jänsch, H, Henderson, M.A, Yates, J.T

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The interaction of carbon tetrachloride with Fe(110) : a system of tribological importance von SMENTKOWSKI, V. S, CHENG, C. C, YATES, J. T. JR

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A comparison of multivariate statistical analysis protocols for ToF-SIMS spectral images: Multivariate Analysis in Surface Analysis - Part I von SMENTKOWSKI, V. S, OSTROWSKI, S. G, KEENAN, M. R

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