Trends in sputtering von Smentkowski, Vincent S.

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Matrix Implanted Laser Desorption Ionization (MILDI) Combined with Ion Mobility-Mass Spectrometry for Bio-Surface Analysis von Tempez, A, Ugarov, M, Egan, T, Schultz, J. A, Novikov, A, Della-Negra, S, Lebeyec, Y, Pautrat, M, Caroff, M, Smentkowski, V. S, Wang, H-Y. J, Jackson, S. N, Woods, A. S

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Multivariate Statistical Analysis of Concatenated Time-of-Flight Secondary Ion Mass Spectrometry Spectral Images. Complete Description of the Sample with One Analysis von Smentkowski, V. S, Keenan, M. R, Ohlhausen, J. A. (Tony), Kotula, P. G

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Multivariate Statistical Analysis of Three-Spatial-Dimension TOF-SIMS Raw Data Sets von Smentkowski, V. S, Ostrowski, S. G, Braunstein, E, Keenan, M. R, Ohlhausen, J. A. (Tony), Kotula, P. G

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Multivariate statistical analysis of non-mass-selected ToF-SIMS data von Smentkowski, V. S., Ostrowski, S. G., Kollmer, F., Schnieders, A., Keenan, M. R., Ohlhausen, J. A., Kotula, P. G.

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Elemental imaging von Pisonero, J, Bordel, N, Smentkowski, V. S

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Fluorination of Diamond Surfaces by Irradiation of Perfluorinated Alkyl Iodides von Smentkowski, V. S., Yates, John T.

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A comparison of multivariate statistical analysis protocols for ToF-SIMS spectral images von Smentkowski, V. S., Ostrowski, S. G., Keenan, M. R.

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Characterization of dilute species within CVD‐grown silicon nanowires doped using trimethylboron: protected lift‐out specimen preparation for atom probe tomography von PROSA, T. J., ALVIS, R., TSAKALAKOS, L., SMENTKOWSKI, V. S.

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Preparation of Self-Assembled Monolayers on InP von Gu, Y, Lin, Z, Butera, R. A, Smentkowski, V. S, Waldeck, D. H

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Effects of Substrate Modification in Wetting of Hydrophobic Materials in ESEM von Castagna, M., Rossi, M., Denault, L., Smentkowski, V.S.

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Atom Probe Tomography Analysis of Grain Boundaries in CdTe von Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Kelly, T.F., Smentkowski, V.S.

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Reduction of artifacts in temperature programmed desorption measurements of field generated, real-life, powered samples von Smentkowski, V. S., Linsebigler, A. L.

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New Applications in Atom Probe Tomography von Larson, D.J., Reinhard, D.A., Prosa, T.J., Olson, D., Lawrence, D., Clifton, P.H., Ulfig, R.M., Martin, I., Kelly, T.F., Smentkowski, V.S., Gordon, L.M., Joester, D., Inoue, K.

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Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate von Smentkowski, V.S., Duong, H.M., Tamaki, R., Keenan, M.R., Ohlhausen, J.A. Tony, Kotula, P.G.

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Deuterium atom interaction with diamond (100) studied by X-ray photoelectron spectroscopy von Smentkowski, V.S, Jänsch, H, Henderson, M.A, Yates, J.T

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Interaction of Cl2 with Fe(110) in the temperature range 90-1050 K von LINSEBIGLER, A. L, SMENTKOWSKI, V. S, ELLISON, M. D, YATES, J. T

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Pulsed ion beam characterization of CVD diamond surfaces under thin film deposition conditions von Krauss, A.R., Im, J., Schultz, J.A., Smentkowski, V.S., Waters, K., Zuiker, C.D., Gruen, D.M., Chang, R.P.H.

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Interface analysis in CdTe/CdS solar cells von Lita, B, Pavol, M J, Dovidenko, K, Le Tarte, L A, Ellis, D, Barbuto, T, Bansal, S, Smentkowski, V S, Young, M, Asher, S E

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Study of the catalytic destruction of dimethyl methylphosphonate: oxidation over Mo(110) von SMENTKOWSKI, V. S, HAGANS, P, YATES, J. T. JR

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