Single-slit diffraction of an optical beam with phase singularity von Ghai, Devinder Pal, Senthilkumaran, P., Sirohi, R.S.

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Introduction to Optical Metrology von Sirohi, Rajpal S

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Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS) von Bhaduri, Basanta, Mohan, N K, Kothiyal, M P, Sirohi, R S

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Detection of phase singularity using a lateral shear interferometer von Ghai, Devinder Pal, Vyas, Sunil, Senthilkumaran, P., Sirohi, R.S.

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Adaptive helical mirror for generation of optical phase singularity von Ghai, Devinder Pal, Senthilkumaran, P, Sirohi, R S

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Characterization of surface topography by confocal microscopy: I. Principles and the measurement system von Udupa, Ganesha, Singaperumal, M, Sirohi, R S, Kothiyal, M P

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Shearograms of a singular beam using wedge plate lateral shear interferometer von Ghai, Devinder Pal, Vyas, Sunil, Senthilkumaran, P., Sirohi, R.S.

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Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities von Udupa, Ganesha, Singaperumal, M, Sirohi, R S, Kothiyal, M P

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Vortex lattice generation using interferometric techniques based on lateral shearing von Ghai, Devinder Pal, Vyas, Sunil, Senthilkumaran, P., Sirohi, R.S.

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Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI) von Sirohi, R S, Burke, J, Helmers, H, Hinsch, K D

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Shearograms of an optical phase singularity von Ghai, Devinder Pal, Senthilkumaran, P., Sirohi, R.S.

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A new approach using a phase-measuring algorithm in detector-width-compensated displacement-measuring interferometer von Shankar, Ajay, Tanwar, L S, Sirohi, R S

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Achromatic phase shifting by a rotating polarizer von Helen, S.Suja, Kothiyal, M.P., Sirohi, R.S.

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Measurement of nonlinear refractive index of Ag and Au nano-particles using moiré technique von Ara, M.H. Majles, Javadi, Z., Sirohi, R.S.

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Phase shifting by a rotating polarizer in white-light interferometry for surface profiling von Helen, S. Suja, Kothiyal, M. P., Sirohi, R. S.

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Optical configuration for measurement in speckle interferometry von Sirohi, R S, Mohan, N K, Santhanakrishnan, T

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Amplitude checker grating from one-dimensional Ronchi grating and its application to array generation von Bhattacharya, S, Sirohi, R S

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Optical bistability by two laser beams in photorefractive crystals von Majles Ara, M.H., Fazilati, M., Abolhasani, M.R., Sirohi, R.S.

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White-light interferometry with polarization phase-shifter at the input of the interferometer von Helen, S. Suja, Kothiyal, M. P., Sirohi, R. S.

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Optical configuration in speckle shear interferometry for slope change contouring with a twofold increase in sensitivity von Santhanakrishnan, T, Palanisamy, P K, Sirohi, R S

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