Strong coupling in the sub-wavelength limit using metamaterial nanocavities von Benz, A., Campione, S., Liu, S., Montaño, I., Klem, J.F., Allerman, A, Wendt, J.R., Sinclair, M.B., Capolino, F., Brener, I.

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Strong Coupling between Nanoscale Metamaterials and Phonons von Shelton, D.J, Brener, I, Ginn, J. C, Sinclair, M. B, Peters, D. W, Coffey, K. R, Boreman, G. D

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Integrated measurement-modeling approaches for evaluating residual stress using micromachined fixed-fixed beams von Baker, M.S., de Boer, M.P., Smith, N.F., Warne, L.K., Sinclair, M.B.

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Spontaneous Pattern Formation on Ion Bombarded Si(001) von Erlebacher, Jonah, Aziz, Michael J., Chason, Eric, Sinclair, Michael B., Floro, Jerrold A.

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Accurate measurements of thermal radiation from a tungsten photonic lattice von Seager, C. H., Sinclair, M. B., Fleming, J. G.

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Electro-optical and optical evaluation of Pb(Zr, Ti)O3 thin films using waveguide refractometry von POTTER, B. G, SINCLAIR, M. B, DIMOS, D, TUTTLE, B. A, SCHWARTZ, R. W

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Dynamic self-organization of strained islands during SiGe epitaxial growth von Floro, J. A., Chason, E., Sinclair, M. B., Freund, L. B., Lucadamo, G. A.

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Dynamics of pattern formation during low-energy ion bombardment of Si(0 0 1) von Chason, Eric, Erlebacher, Jonah, Aziz, Michael J., Floro, J.A., Sinclair, M.B.

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An all-dielectric metasurface as a broadband optical frequency mixer von Liu, S, Vabishchevich, P.P, Vaskin, A, Reno, J.L, Keeler, G.A, Sinclair, M.B, Staude, I, Brener, I

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Spectroscopic light scattering for real-time measurements of thin film and surface evolution von Chason, Eric, Sinclair, Michael B., Floro, Jerry A., Hunter, John A., Hwang, Robert Q.

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Synthetic infrared spectra von Sinclair, M B, Butler, M A, Kravitz, S H, Zubrzycki, W J, Ricco, A J

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Discoloration and subsequent recovery of optical polymers exposed to ionizing radiation von Clough, R.L., Malone, G.M., Gillen, K.T., Wallace, J.S., Sinclair, M.B.

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Hyperspectral imaging system for quantitative identification and discrimination of fluorescent labels in the presence of autofluorescence von Nieman, L.T., Sinclair, M.B., Timlin, J.A., Jones, H.D.T., Haaland, D.M.

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Electro-optical characterization of Pb(Zr,Ti)O[sub 3] thin films by waveguide refractometry von Potter, B.G. Jr, Sinclair, M.B., Dimos, D.

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Photoinduced hysteresis changes and optical storage in (Pb,La)(Zr,Ti)O[sub 3] thin films and ceramics von Dimos, D., Warren, W.L., Sinclair, M.B., Tuttle, B.A., Schwartz, R.W.

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Photosensitive thin film materials and devices von Simmons-Potter, K, Potter Jr, B.G, Meister, D.C, Sinclair, M.B

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Color center annealing in γ - irradiated polystyrene, under vacuum and air atmospheres von Wallace, J.S., Sinclair, M.B., Gillen, K.T., Clough, R.L.

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Subpicosecond photoinduced absorption in poly[2,5-thienylene vinylene] and poly[3-methoxy-6-(2-ethyl-hexyloxy) phenylene vinylene] von Sinclair, M.B, McBranch, D, Hagler, T.W, Heeger, A.J

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Waveguide refractometry as a probe of thin film optical uniformity von Potter, B. G., Dimos, D., Sinclair, M. B.

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Electro-optical and optical evaluation of Pb(Zr, Ti)O 3 thin films using waveguide refractometry von Potter, B.G., Sinclair, M.B., Dimos, D., Tuttle, B.A., Schwartz, R.W.

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