Potential‐Dependent Morphology of Copper Catalysts During CO2 Electroreduction Revealed by In Situ Atomic Force Microscopy von Simon, Georg H., Kley, Christopher S., Roldan Cuenya, Beatriz

Volltext

Potential-Dependent Morphology of Copper Catalysts During CO 2 Electroreduction Revealed by In Situ Atomic Force Microscopy von Simon, Georg H, Kley, Christopher S, Roldan Cuenya, Beatriz

Volltext

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy von König, Thomas, Simon, Georg H, Heinke, Lars, Lichtenstein, Leonid, Heyde, Markus

Volltext

Atomic-Scale Imprinting by Sputter Deposition of Amorphous Metallic Films von Chen, Zheng, Datye, Amit, Simon, Georg H, Zhou, Chao, Kube, Sebastian A, Liu, Naijia, Liu, Jingbei, Schroers, Jan, Schwarz, Udo D

Volltext

Atomic imprinting in the absence of an intrinsic length scale von Zhou, Chao, Datye, Amit, Chen, Zheng, Simon, Georg H., Wang, Xinzhe, Schroers, Jan, Schwarz, Udo D.

Volltext

Potentialabhängige Morphologie von Kupferkatalysatoren während der Elektroreduktion von CO2, ermittelt durch In‐situ‐Rasterkraftmikroskopie von Simon, Georg H., Kley, Christopher S., Roldan Cuenya, Beatriz

Volltext

Atomic imprinting into metallic glasses von Li, Rui, Chen, Zheng, Datye, Amit, Simon, Georg H., Ketkaew, Jittisa, Kinser, Emily, Liu, Ze, Zhou, Chao, Dagdeviren, Omur E., Sohn, Sungwoo, Singer, Jonathan P., Osuji, Chinedum O., Schroers, Jan, Schwarz, Udo D.

Volltext

Revealing surface-state transport in ultrathin topological crystalline insulator SnTe films von Zou, Ke, Albright, Stephen D., Dagdeviren, Omur E., Morales-Acosta, M. D., Simon, Georg H., Zhou, Chao, Mandal, Subhasish, Ismail-Beigi, Sohrab, Schwarz, Udo D., Altman, Eric I., Walker, Frederick J., Ahn, Charles H.

Volltext

Surface phase, morphology, and charge distribution transitions on vacuum and ambient annealed SrTiO3(100) von Dagdeviren, Omur E, Simon, Georg H, Zou, Ke, Walker, Fred J, Ahn, Charles, Altman, Eric I, Schwarz, Udo D

Volltext

Local Work Function Differences at Line Defects in Aluminium Oxide on NiAl(110) von Heinke, Lars, Lichtenstein, Leonid, Simon, Georg H., König, Thomas, Heyde, Markus, Freund, Hans-Joachim

Volltext

Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films von Dagdeviren, Omur E., Zhou, Chao, Zou, Ke, Simon, Georg H., Albright, Stephen D., Mandal, Subhasish, Morales‐Acosta, Mayra D., Zhu, Xiaodong, Ismail‐Beigi, Sohrab, Walker, Frederick J., Ahn, Charles H., Schwarz, Udo D., Altman, Eric I.

Volltext

Resolving oxide surfaces - From point and line defects to complex network structures von Heyde, Markus, Simon, Georg H., Lichtenstein, Leonid

Volltext

Potentialabhängige Morphologie von Kupferkatalysatoren während der Elektroreduktion von CO 2 , ermittelt durch In‐situ‐Rasterkraftmikroskopie von Simon, Georg H., Kley, Christopher S., Roldan Cuenya, Beatriz

Volltext

Atomic imprinting in the absence of an intrinsic length scale von Zhou, Chao, Datye, Amit, Chen, Zheng, Simon, Georg H., Wang, Xinzhe, Schroers, Jan, Schwarz, Udo D.

Volltext

Back Cover: Resolving oxide surfaces - From point and line defects to complex network structures (Phys. Status Solidi B 5/2013) von Heyde, Markus, Simon, Georg H., Lichtenstein, Leonid

Volltext

The role of double TiO2 layers at the interface of FeSe/SrTiO3 superconductors von Zou, Ke, Bozovic, Ian, Mandal, Subhasish, Albright, Stephen, Peng, Rui, Kumah, Divine, Simon, Georg, Dagdeviren, Omur, He, Xi, Schwarz, Udo, Altman, Eric, Feng, Donglai, Walker, F. J., Ismail-Geigi, Sohrab, Ahn, C. H.

Volltext

Direct Measurement of the Attractive Interaction Forces on F 0 Color Centers on MgO(001) by Dynamic Force Microscopy von König, Thomas, Simon, Georg H., Martinez, Umberto, Giordano, Livia, Pacchioni, Gianfranco, Heyde, Markus, Freund, Hans-Joachim

Volltext

Suppression of the spectral weight of topological surface states on the nanoscale via local symmetry breaking von Dagdeviren, Omur E., Mandal, Subhasish, Zou, Ke, Zhou, Chao, Simon, Georg H., Walker, Frederick J., Ahn, Charles H., Schwarz, Udo D., Ismail-Beigi, Sohrab, Altman, Eric I.

Volltext

Crystalline Insulators: Length Scale and Dimensionality of Defects in Epitaxial SnTe Topological Crystalline Insulator Films (Adv. Mater. Interfaces 2/2017) von Dagdeviren, Omur E., Zhou, Chao, Zou, Ke, Simon, Georg H., Albright, Stephen D., Mandal, Subhasish, Morales‐Acosta, Mayra D., Zhu, Xiaodong, Ismail‐Beigi, Sohrab, Walker, Frederick J., Ahn, Charles H., Schwarz, Udo D., Altman, Eric I.

Volltext

Direct Measurement of the Attractive Interaction Forces on F0 Color Centers on MgO(001) by Dynamic Force Microscopy von König, Thomas, Simon, Georg H, Martinez, Umberto, Giordano, Livia, Pacchioni, Gianfranco, Heyde, Markus, Freund, Hans-Joachim

Volltext