Latest Geant4 developments for PIXE applications von Bakr, S., Cohen, D.D., Siegele, R., Incerti, S., Ivanchenko, V., Mantero, A., Rosenfeld, A., Guatelli, S.

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Vacancy-related defects in n-type Si implanted with a rarefied microbeam of accelerated heavy ions in the MeV range von Capan, I., Pastuović, Ž., Siegele, R., Jaćimović, R.

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Charge collection efficiency degradation induced by MeV ions in semiconductor devices: Model and experiment von Vittone, E., Pastuovic, Z., Breese, M.B.H., Garcia Lopez, J., Jaksic, M., Raisanen, J., Siegele, R., Simon, A., Vizkelethy, G.

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Iron deposition in modern and archaeological teeth von Williams, A.-M.M., Siegele, R.

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The investigation of prostatic calcifications using μ-PIXE analysis and their dosimetric effect in low dose rate brachytherapy treatments using Geant4 von Pope, D J, Cutajar, D L, George, S P, Guatelli, S, Bucci, J A, Enari, K E, Miller, S, Siegele, R, Rosenfeld, A B

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Generation of vacancy cluster-related defects during single MeV silicon ion implantation of silicon von Pastuović, Ž., Capan, I., Siegele, R., Jačimović, R., Forneris, J., Cohen, D.D., Vittone, E.

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Scanning force microscopy of 129Iodine surface impact structures in muscovite, zircon and apatite as proxies for damage of simulated fission fragments in solids von Kohlmann, F., Kohn, B.P., Gleadow, A.J.W., Siegele, R.

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Comparison of in vivo binding properties of the 18-kDa translocator protein (TSPO) ligands [18F]PBR102 and [18F]PBR111 in a model of excitotoxin-induced neuroinflammation von Callaghan, P. D., Wimberley, C. A., Rahardjo, G. L., Berghofer, P. J., Pham, T. Q., Jackson, T., Zahra, D., Bourdier, T., Wyatt, N., Greguric, I., Howell, N. R., Siegele, R., Pastuovic, Z., Mattner, F., Loc’h, C., Gregoire, M. C., Katsifis, A.

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Investigation of the mouse cerebellum using STIM and μ-PIXE spectrometric and FTIR spectroscopic mapping and imaging von Hackett, M.J., Siegele, R., El-Assaad, F., McQuillan, J.A., Aitken, J.B., Carter, E.A., Grau, G.E., Hunt, N.H., Cohen, D., Lay, P.A.

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Chemical alterations to murine brain tissue induced by formalin fixation: implications for biospectroscopic imaging and mapping studies of disease pathogenesis von HACKETT, Mark J, MCQUILLAN, James A, LAY, Peter A, EL-ASSAAD, Fatima, AITKEN, Jade B, LEVINA, Aviva, COHEN, David D, SIEGELE, Rainer, CARTER, Elizabeth A, GRAU, Georges E, HUNT, Nicholas H

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A Cylindrical Silicon-on-Insulator Microdosimeter: Charge Collection Characteristics von Ziebell, A.L., Lim, W.H., Reinhard, M.I., Cornelius, I., Prokopovich, D.A., Siegele, R., Dzurak, A.S., Rosenfeld, A.B.

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The new confocal heavy ion microprobe beamline at ANSTO: The first microprobe resolution tests and applications for elemental imaging and analysis von Pastuovic, Z., Siegele, R., Cohen, D.D., Mann, M., Ionescu, M., Button, D., Long, S.

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Doping of ZnO Thin Film with Eu Using Ion Beams von Siegele, R., Li, S., Yu, D., Cohen, D.D., Photongkam, P., Ionescu, Mihail

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Hydrogen Measurements in SiNx: H/Si Thin Films by ERDA von McIntosh, Keith, Cohen, D.D., Chandra, Tara, Richards, Bryce, Ionescu, Mihail, Siegele, R., Stelcer, E.

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Localisation of trace metals in metal-accumulating plants using µ-PIXE von Siegele, R., Kachenko, A. G., Bhatia, N. P., Wang, Y. D., Ionescu, M., Singh, B., Baker, A. J. M., Cohen, D. D.

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Determination of radiation hardness of silicon diodes von Vittone, E., Garcia Lopez, J., Jaksic, M., Jimenez Ramos, M.C., Lohstroh, A., Pastuovic, Z., Rath, S., Siegele, R., Skukan, N., Vizkelethy, G., Simon, A.

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LET dependence of the charge collection efficiency of silicon microdosimeters von Cornelius, I.M., Rosenfeld, A.B., Siegele, R., Cohen, D.D.

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X-ray absorption spectroscopy at the NiK edge in Stackhousia tryonii Bailey hyperaccumulator von Ionescu, M., Bhatia, N. P., Cohen, D. D., Kachenko, A., Siegele, R., Marcus, M. A., Fakra, S., Foran, G.

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Enhanced biocompatibility of PDMS (polydimethylsiloxane) polymer films by ion irradiation von Ionescu, M., Winton, B., Wexler, D., Siegele, R., Deslantes, A., Stelcer, E., Atanacio, A., Cohen, D.D.

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ERDA with very heavy ion beams von Assmann, W., Davies, J.A., Dollinger, G., Forster, J.S., Huber, H., Reichelt, Th, Siegele, R.

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