On the Physical Mechanism of the Interaction of the Microwave Radiation with the Semiconductor Diodes von Shurenkov, V.V.

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True dose rate physical mechanism of ELDRS effect in bipolar devices von Pershenkov, V.S., Petrov, A.S., Bakerenkov, A.S., Ulimov, V.N., Felytsyn, V.A., Rodin, A.S., Belyakov, V.V., Telets, V.A., Shurenkov, V.V.

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Temperature control system for the study of single event effects in integrated circuits using a cyclotron accelerator von Bakerenkov, A.S., Belyakov, V.V., Kozyukov, A.E., Pershenkov, V.S., Solomatin, A.V., Shurenkov, V.V.

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Mechanism of the Saturation of the Radiation Induced Interface Trap Buildup von Bakerenkov, A.S., Shurenkov, V.V., Pershenkov, V.S., Belyakov, V.V., Solomatin, A.V.

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Radiation Degradation Modeling of Bipolar Operational Amplifier Input Offset Voltage in LTSpice IV von Shurenkov, V.V., Bakerenkov, A.S., Pershenkov, V.S., Solomatin, A.V., Belyakov, V.V.

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Effect of Radiation Induced Charge Neutralization on ELDRS von Shurenkov, V.V., Bakerenkov, A.S., Belyakov, V.V., Yastrebov, A.T., Pershenkov, V.S., Solomatin, A.V.

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Using Low Temperature Irradiation for ELDRS Estimation von Shurenkov, V.V., Bakerenkov, A.S., Belyakov, V.V., Yastrebov, A.T., Pershenkov, V.S., Solomatin, A.V.

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