Gas permeation of polymer blends. I. PVC/ethylene-vinyl acetate copolymer (EVA) von Shur, Young J., Rånby, Bengt

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Gas permeation of polymer blends. IV. Poly(vinyl chloride) (PVC)/acrylonitrile-butadiene-styrene (ABS) terpolymer von Shur, Young J., Rånby, Bengt

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Gas permeation of polymer blends. II. Poly(vinyl chloride)/acrylonitrile-butadiene copolymer (NBR) blends von Shur, Young J., Rånby, Bengt

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Gas permeation of polymer blends. III. Poly(vinyl chloride) (PVC)/chlorinated polyethylene (CPE) von Shur, Young J., Rånby, Bengt

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Antiplasticization and transition to marked nonlinear viscoelasticity in poly(vinyl chloride) (PVC)/poly-ε-caprolactone (PCL) blends von Sundgren, Nils, Bergman, Gunnar, Shur, Young J.

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Antiplasticization and transition to marked nonlinear viscoelasticity in poly(vinyl chloride)/acrylonitrile-butadiene copolymer blends von Bergman, Gunnar, Bertilsson, Hans, Shur, Young J.

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Antiplasticization and transition to marked nonlinear viscoelasticity in poly(vinyl chloride) (PVC)/poly-ɛ-caprolactone (PCL) blends von Sundgren, Nils, Bergman, Gunnar, Shur, Young J.

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Gas permeation of polymer blends. V. Compatibility studies of poly(vinyl chloride)/poly-ε-caprolactone blends von Shur, Young J., Rnby, Bengt

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Phase relations in poly(vinyl chloride)/ethylene--vinyl acetate copolymer blends with low contents of the EVA polymer von Svanson, S. E., Elmqvist, C., Shur, Young J., Rånby, B.

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Kinetic studies on shear degradation of polystyrene during extrusion von Shur, Young J., Rånby, Bengt, Chung, Ki-Hyun, Kim, Sang-Dae

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Studies of the photooxidation mechanism of polymers. III. Role of tetrahydrofuran in the photooxidative degradation of poly(vinyl chloride) von Rabek, Jan F., Shur, Young J., Rårnby, B.

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Evaluation of the N- and La-induced defects in the high-κ gate stack using low frequency noise characterization von Young, C.D., Veksler, D., Rumyantsev, S., Huang, J., Park, H., Taylor, W., Shur, M., Bersuker, G.

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Intermetallic compound layer formation between Sn-3.5 mass %Ag BGA solder ball and (Cu, immersion Au/electroless Ni-P/Cu) substrate von LEE, Chang-Bae, YOON, Jeong-Won, SUH, Su-Jeong, JUNG, Seung-Boo, YANG, Cheol-Woong, SHUR, Chang-Chae, SHIN, Young-Eui

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Evaluation of the N- and La-induced defects in the high-[kappa] gate stack using low frequency noise characterization von Young, C D, Veksler, D, Rumyantsev, S, Huang, J, Park, H, Taylor, W, Shur, M, Bersuker, G

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The cyclotron resonance effective mass of two-dimensional electrons confined at the GaN/AlGaN interface von Knap, W, Alause, H, Bluet, J.M, Camassel, J, Young, J, Asif Khan, M, Chen, Q, Huant, S, Shur, M

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Enhanced CAD model for gate leakage current in heterostructure field effect transistors von Kie Young Lee, Lund, B., Ytterdal, T., Robertson, P., Martinez, E.J., Robertson, J., Shur, M.S.

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Evaluation of the N- and La-induced defects in the high-K gate stack using low frequency noise characterization von YOUNG, C. D, VEKSLER, D, RUMYANTSEV, S, HUANG, J, PARK, H, TAYLOR, W, SHUR, M, BERSUKER, G

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A unified current-voltage model for long-channel nMOSFETs von Chan-Kwang Park, Chang-Yeol Lee, Kwyro Lee, Byung-Jong Moon, Young Hee Byun, Shur, M.

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Optical and electrical properties of 2-dimensional electron gas in GaN/AlGaN heterostructures von Alause, H., Knap, W., Azema, S. Contreras, Bluet, J.M., Sadowski, M.L., Huant, S., Young, J., Khan, M. Asif, Chen, Q., Shur, M.

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New continuous heterostructure field-effect-transistor model and unified parameter extraction technique von Moon, B.-J., Byun, Y.H., Lee, K., Shur, M.

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