Manipulation of resistive state of silicon oxide memristor by means of current limitation during electroforming von Korolev, D.S., Belov, A.I., Okulich, E.V., Okulich, V.I., Guseinov, D.V., Sidorenko, K.V., Shuisky, R.A., Antonov, I.N., Gryaznov, E.G., Gorshkov, O.N., Tetelbaum, D.I., Mikhaylov, A.N.

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