Analysis of neutron-induced single-event burnout in SiC power MOSFETs von Shoji, Tomoyuki, Nishida, Shuichi, Hamada, Kimimori, Tadano, Hiroshi

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Analysis of intrinsic reverse leakage current resulting from band-to-band tunneling in dislocation-free GaN p–n junctions von Shoji, Tomoyuki, Narita, Tetsuo, Nagasato, Yoshitaka, Kanechika, Masakazu, Kondo, Takeshi, Uesugi, Tsutomu, Tomita, Kazuyoshi, Ikeda, Satoshi, Mori, Tomohiko, Yamaguchi, Satoshi, Kimoto, Yasuji, Kojima, Jun, Suda, Jun

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Experimental and simulation studies of neutron-induced single-event burnout in SiC power diodes von Shoji, Tomoyuki, Nishida, Shuichi, Hamada, Kimimori, Tadano, Hiroshi

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Theoretical analysis of short-circuit capability of SiC power MOSFETs von Shoji, Tomoyuki, Soeno, Akitaka, Toguchi, Hiroaki, Aoi, Sachiko, Watanabe, Yukihiko, Tadano, Hiroshi

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Dependence of Short-Circuit Withstand Capability of SiC MOSFETs on Short-Circuit Failure Time von Shoji, Tomoyuki, Kuwahara, Makoto, Usui, Masanori

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Triggering Mechanism for Neutron Induced Single-Event Burnout in Power Devices von Shoji, Tomoyuki, Nishida, Shuichi, Hamada, Kimimori

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Observation and Analysis of Neutron-Induced Single-Event Burnout in Silicon Power Diodes von Shoji, Tomoyuki, Nishida, Shuichi, Hamada, Kimimori, Tadano, Hiroshi

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Cosmic ray neutron-induced single-event burnout in power devices von Shoji, Tomoyuki, Nishida, Shuichi, Hamada, Kimimori, Tadano, Hiroshi

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Erratum: "Triggering Mechanism for Neutron Induced Single Event Burnout in Power Devices" von Shoji, Tomoyuki, Nishida, Shuichi, Hamada, Kimimori

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Theoretical Analysis on Temperature Dependency of Short-Circuit Capability von Shoji, Tomoyuki, Saito, Jun, Ishiko, Masayasu

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Cosmic ray ruggedness of IGBTs for hybrid vehicles von Nishida, S, Shoji, T, Ohnishi, T, Fujikawa, T, Nose, N, Ishiko, M, Hamada, K

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Effect of Liquid Additives and Behavior of Alumina Powder in Ultrafine Grinding of Alumina von Hasegawa, Masahiro, Kimata, Mitsumasa, Shoji, Tomoyuki

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Cosmic Ray Ruggedness of Power Semiconductor Devices for Hybrid Vehicles von Nishida, Shuichi, Shoji, Tomoyuki, Ohnishi, Toyokazu, Fujikawa, Touma, Nose, Noboru, Ishiko, Masayasu, Hamada, Kimimori

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JIG FOR PILE DRIVING von SAWAISHI, Masamichi, SHOJI, Tomoyuki, OKI, Hitoshi, FUKUMURA, Koka

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METHOD OF INSTALLATION OF SCREWED PILE, METHOD OF PRODUCTION OF GROUP OF PILES, GROUP OF PILES, INSTALLATION MANAGEMENT APPARATUS OF SCREWED PILE, AND INSTALLATION MANAGEMENT SYSTE... von SAWAISHI, Masamichi, SHOJI, Tomoyuki, OKI, Hitoshi, FUKUMURA, Koka

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METHOD OF INSTALLATION OF SCREWED PILE, METHOD OF PRODUCTION OF GROUP OF PILES, AND GROUP OF PILES von SAWAISHI, Masamichi, SHOJI, Tomoyuki, OKI, Hitoshi, FUKUMURA, Koka

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JIG FOR PILE DRIVING von SAWAISHI, Masamichi, SHOJI, Tomoyuki, OKI, Hitoshi, FUKUMURA, Koka

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NITRIDE SEMICONDUCTOR DEVICE von NAKADA NAOYUKI, SHOJI TOMOYUKI, MORI TOMOHIKO

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Nitride semiconductor device von NAKADA NAOYUKI, SHOJI TOMOYUKI, MORI TOMOHIKO

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HONEYCOMB STRUCTURE MANUFACTURING METHOD von SHOJI TOMOYUKI

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