Applications of high-resolution MFM system with low-moment probe in a vacuum von Yamaoka, T., Watanabe, K., Shirakawabe, Y., Chinone, K., Saitoh, E., Tanaka, M., Miyajima, H.

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Performance of the carbon nano-tube assembled tip for surface shape characterization von Yasutake, M, Shirakawabe, Y, Okawa, T, Mizooka, S, Nakayama, Y

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Non‐optical tip–sample distance control method for scanning near‐field optical microscopy using a piezoresistive micro cantilever von Muramatsu, H., Egawa, A., Homma, K., Kim, J.‐M., Takahashi, H., Shirakawabe, Y., Shimizu, N.

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Self-sensing piezoresistive cantilever and its magnetic force microscopy applications von Takahashi, Hiroshi, Ando, Kazunori, Shirakawabe, Yoshiharu

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Nano-Four-Point Probes on Microcantilever System Fabricated by Focused Ion Beam von Nagase, Masao, Takahashi, Hiroshi, Shirakawabe, Yoshiharu, Namatsu, Hideo

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Observations of Single Magnetic Domain Wall in Nanomagnet by Magnetic Force Microscopy von Yamaoka, Takehiro, Watanabe, Kazutoshi, Shirakawabe, Yoshiharu, Chinone, Kazuo, Saitoh, Eiji, Miyajima, Hideki

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Magnetic Domain Wall Manipulation using MFM Probe von Yamaoka, T., Saitoh, E., Machida, K., Tanaka, M., Watanabe, K., Shirakawabe, Y., Miyajima, H.

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High-Sensitivity, High-Resolution Magnetic Force Microscopy System von Yamaoka, T., Watanabe, K., Shirakawabe, Y., Chinone, K.

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3P301 The subject arid the possibility of biomaterial observation by SPM von Shigeno, M., Nihei, A., Matsuzawa, O., Watanabe, N., Shirakawabe, Y., Inoue, A.

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High-Sensitivity, High-Resolution Magnetic Force Microscopy System von Yamaoka, T., Watanabe, K., Shirakawabe, Y., Chinone, K.

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MFM探針による磁壁操作 von 山岡, 武博, 齊藤, 英治, 町田, 賢司, 田中, 雅章, 渡辺, 和俊, 白川部, 喜春, 宮島, 英紀

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Applications of high-resolution MFM system with low moment probe and Q-control in vacuum von Yamaoka, T., Watanabe, K., Shirakawabe, Y., Chinone, K., Saitoh, E., Tanaka, M., Miyajima, H.

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3P301 走査型プローブ顕微鏡による生体試料観察の課題と可能性(計測) von 繁野, 雅次, 二瓶, 亜三子, 松澤, 修, 渡邉, 直哉, 白川部, 喜春, 井上, 明

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CONDUCTIVE PROBE FOR SCANNING MICROSCOPE AND MACHINING METHOD USING THE SAME von NAKAYAMA, YOSHIKAZU, HARADA, AKIO, YASUTAKE, M, SHIRAKAWABE,Y, TAKANO, YUICHI, AKITA, SEIJI, OKAWA, TAKASHI

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高感度・高分解能MFMシステムの開発 von 山岡, 武博, 渡辺, 和俊, 白川部, 喜春, 茅根, 一夫

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CONDUCTIVE PROBE FOR SCANNING MICROSCOPE AND MACHINING METHOD USING THE SAME von NAKAYAMA, YOSHIKAZU, HARADA, AKIO, YASUTAKE, M, SHIRAKAWABE,Y, TAKANO, YUICHI, AKITA, SEIJI, OKAWA, TAKASHI

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Dual-cantilever AFM probe for combining fast and coarse imaging with high-resolution imaging von Despont, M., Takahashi, H., Ichihara, S., Shirakawabe, Y., Shimizu, N., Inoue, A., Haberle, W., Binnig, G.K., Vettiger, P.

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