45 Years in Monte Carlo Simulation for Microbeam Analysis: A personal retrospective review von Shimizu, Ryuichi

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Simple and rapid quantification of chromium, arsenic, and selenium in bituminous coal samples using a desktop energy dispersive X-ray fluorescence analyzer von Shimizu, Ryuichi, Masaki, Hiroyuki, Yasuike, Shinji

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Dynamic observation of an atom-sized gold wire by phase electron microscopy von Takai, Y, Kawasaki, T, Kimura, Y, Ikuta, T, Shimizu, R

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Petrology of Myogazawa and Kazamiyamada volcanic rocks distributed in northern Utsunomiya, central Japan von SHIMIZU, Ryuichi

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Experimental and theoretical studies on X-ray induced secondary electron yields in Ti and TiO2 von IYASU, Takeshi, TAMURA, Keiji, SHIMIZU, Ryuichi, VLAICU, Mihai Aurel, YOSHIKAWA, Hideki

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New Computer Simulation Software of Electron Trajectories for Evaluation of Magnetic Field Immersion-Type Field Emission Gun von Tamura, Keiji, Ikuta, Takashi, Shimizu, Ryuichi, Ichihashi, Mikio

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Distorted surface and interface structures of catalytic gold nanoparticles observed by spherical aberration-free phase electron microscopy von Kawasaki, Tadahiro, Takai, Yoshizo, Shimizu, Ryuichi

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APPLICATION OF THE FOCUSED-ION-BEAM TECHNIQUE FOR PREPARING THE CROSS-SECTIONAL SAMPLE OF CHEMICAL VAPOR-DEPOSITION DIAMOND THIN-FILM FOR HIGH-RESOLUTION TRANSMISSION ELECTRON-MICR... von TARUTANI, M, TAKAI, Y, SHIMIZU, R

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Angular distribution of X-ray photoelectrons emitted from silver von Zhang, Zengming, Ding, Zejun, Koshikawa, Takanori, Iyasu, Takesi, Shimizu, Ryuichi, Yoshikawa, Hideki, Fukushima, Sei, Tanaka, Akihiro

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An advanced ionizing radiation monitoring network based on using SrI2(Eu)/MPPC module von Nagai, Shigekazu, Kawamura, Ken, Kimura, Yoshihide, Yoshii, Junji, Ikeda, Renzo, Shimizu, Ryuichi

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Determination of effective energy loss functions and x-ray photoelectron spectroscopy source functions for Si 2p photoelectrons from clean Si(111), oxygen-adsorbed Si(111) and SiO2... von Nagatomi, Takaharu, Kawano, Takashi, Shimizu, Ryuichi

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An advanced ionizing radiation monitoring network based on using SrI 2 (Eu)/MPPC module von Nagai, Shigekazu, Kawamura, Ken, Kimura, Yoshihide, Yoshii, Junji, Ikeda, Renzo, Shimizu, Ryuichi

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Quantitative analysis by Auger electron spectroscopy von SHIMIZU, R

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Real-time lock-in imaging by a newly developed high-speed image-processing charge coupled device video camera von Nishikata, Kentarou, Kimura, Yoshihide, Takai, Yoshizo, Ikuta, Takashi, Shimizu, Ryuichi

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Monte Carlo Simulation of Secondary Electron Emission from Tungsten Surfaces with Various Work Functions as Applied to Sc/W Surfaces von Takashi Kawano, Takashi Kawano, Z.-J. Ding, Z.-J. Ding, Ryuichi Shimizu, Ryuichi Shimizu

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Monte-Carlo simulation of secondary electron emission by x-ray irradiation-an application of x-ray absorption near-edge structure (XANES) von Iyasu, Takeshi, Tamura, Keiji, Shimizu, Ryuichi, Zhang, Zengming, Koshikawa, Takanori, Yoshikawa, Hideki, Fukushima, Sei

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Comparison of Energy-Loss Functions from Reflection Electron Energy-Loss Spectroscopy Spectra with Surface and Bulk Energy-Loss Functions: in Case of Cu von Zhang, Zengming, Koshikawa, Takanori, Iyasu, Takeshi, Shimizu, Ryuichi, Goto, Keisuke

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High-resolution Auger depth profiling by sub-keV ion sputtering von Inoue, Masahiko, Shimizu, Ryuichi, Lee, Hyung Ik, Kang, Hee Jae

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Monte-Carlo simulation of x-ray photoelectron emission from silver von Zhang, Zengming, Koshikawa, Takanori, Iyasu, Takeshi, Shimizu, Ryuichi, Goto, Keisuke, Tanaka, Akihiro

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Characterization of Sc–O/W(100) Surface as Schottky Emitter: Work Function Change for Activation Processing von Kawano, Takashi, Takai, Yoshizo, Shimizu, Ryuichi

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