Highly luminescent near-infrared Cu-doped InP quantum dots with a Zn-Cu-In-S/ZnS double shell scheme von Kim, Jiyong, Choi, Hyung Seok, Wedel, Armin, Yoon, Suk-Young, Jo, Jung-Ho, Kim, Hyun-Min, Han, Chul-Jong, Song, Hong-Joo, Yi, Jeong-Min, Jang, Jong-Shik, Zschiesche, Hannes, Lee, Bum-Joo, Park, Kyoungwon, Yang, Heesun

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Thickness measurement of a thin hetero-oxide film with an interfacial oxide layer by X-ray photoelectron spectroscopy von Kim, Kyung Joong, Lee, Seung Mi, Jang, Jong Shik, Moret, Mona

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Accurate determination of the surface normal for the reliable measurement of ultra-thin SiO2 thickness by x-ray photoelectron spectroscopy von Joong Kim, Kyung, Shik Jang, Jong, Won Moon, Dae

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Accurate quantification of Cu(In,Ga)Se2 films by AES depth profiling analysis von Jang, Jong Shik, Hwang, Hye Hyen, Kang, Hee Jae, Chae, Hong-Chol, Chung, Yong-Duck, Kim, Kyung Joong

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SIMS depth profiling analysis of P-doped n-type Si layer to develop the Si QD solar cell von Kim, Tae Woon, Baek, Hyun Jeong, Jang, Jong Shik, Lee, Seung Mi, Kim, Kyung Joong

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A method to determine the interface position and layer thickness in SIMS depth profiling of multilayer films von Kim, Kyung Joong, Jang, Jong Shik, Moon, Dae Won, Kang, Hee Jae

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CCQM pilot study CCQM-P140: quantitative surface analysis of multi-element alloy films von Kim, Kyung Joong, Jang, Jong Shik, Kim, An Soon, Suh, Jung Ki, Chung, Yong-Duck, Hodoroaba, Vasile-Dan, Wirth, Thomas, Unger, Wolfgang, Kang, Hee Jae, Popov, Oleg

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A mutual calibration method to certify the thickness of nanometre oxide films von Kim, Kyung Joong, Kim, Yong-Sung, Jang, Jong Shik, Kim, Jeong Won, Kim, Kyoung Won

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Quantitative analysis of Si1-xGex alloy films by SIMS and XPS depth profiling using a reference material von Oh, Won Jin, Jang, Jong Shik, Lee, Youn Seoung, Kim, Ansoon, Kim, Kyung Joong

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Mechanism of abnormal interface artifacts in SIMS depth profiling of a Si/Ge multilayer by oxygen ions von Jang, Jong Shik, Kang, Hee Jae, Kim, Kyung Joong

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Active doping of B in silicon nanostructures and development of a Si quantum dot solar cell von Hong, Seung Hui, Kim, Yong Sung, Lee, Woo, Kim, Young Heon, Song, Jae Yong, Jang, Jong Shik, Park, Jae Hee, Choi, Suk-Ho, Kim, Kyung Joong

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Determination of the Absolute Thickness of Ultrathin Al^sub 2^O^sub 3^ Overlayers on Si (100) Substrate von Kim, Kyung Joong, Jang, Jong Shik

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Determination of interface locations and layer thicknesses in SIMS and AES depth profiling of Si/Ti multilayer films by 50 at% definition von Hwang, Hye Hyun, Jang, Jong Shik, Kang, Hee Jae, Kim, Kyung Joong

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In situ control of oxygen vacancies in TiO 2 by atomic layer deposition for resistive switching devices von Park, Sang-Joon, Lee, Jeong-Pyo, Jang, Jong Shik, Rhu, Hyun, Yu, Hyunung, You, Byung Youn, Kim, Chang Soo, Kim, Kyung Joong, Cho, Yong Jai, Baik, Sunggi, Lee, Woo

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Determination of the Absolute Thickness of Ultrathin Al 2 O 3 Overlayers on Si (100) Substrate von Kim, Kyung Joong, Jang, Jong Shik, Lee, Joo-Hee, Jee, Yun-Jung, Jun, Chung-Sam

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Quantitative analysis of Cu(In,Ga)Se 2 thin films by secondary ion mass spectrometry using a total number counting method von Jang, Jong Shik, Hwang, Hye Hyen, Kang, Hee Jae, Suh, Jung Ki, Min, Hyung Sik, Han, Myung Sub, Cho, Kyung Haeng, Chung, Yong-Duck, Cho, Dae-Hyung, Kim, Jeha, Kim, Kyung Joong

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Quantitative analysis of Cu(In,Ga)Se sub( 2) thin films by secondary ion mass spectrometry using a total number counting method von Jang, Jong Shik, Hwang, Hye Hyen, Kang, Hee Jae, Suh, Jung Ki, Min, Hyung Sik, Han, Myung Sub, Cho, Kyung Haeng, Chung, Yong-Duck, Cho, Dae-Hyung, Kim, Jeha

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Quantitative analysis of Cu(In,Ga)Se^sub 2^ thin films by secondary ion mass spectrometry using a total number counting method von Jang, Jong Shik, Hwang, Hye Hyen, Kang, Hee Jae, Suh, Jung Ki, Min, Hyung Sik, Han, Myung Sub, Cho, Kyung Haeng, Chung, Yong-Duck, Cho, Dae-Hyung, Kim, Jeha

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Photo active layer by silicon quantum dot and the fabrication method thereof von Park Jae Hee, Kim Kyoung Joong, Hong Seung Hui, Jang Jong Shik

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Photo Active Layer by Silicon Quantum Dot and the Fabrication Method Thereof von PARK JAE HEE, KIM KYOUNG JOONG, JANG JONG SHIK, HONG SEUNG HUI

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