Enhanced output power of near-ultraviolet InGaN-GaN LEDs grown on patterned sapphire substrates von Wuu, D.S., Wang, W.K., Shih, W.C., Horng, R.H., Lee, C.E., Lin, W.Y., Fang, J.S.

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TSV by 355 UV laser for 4G component packaging with micro-electroforming von Pan, C.T., Chen, Y.C., Wang, S.Y., Cheng, Y.T., Yen, C.K., Lin, Y.L., Shih, W.C.

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Characteristics of transparent conductive Al-doped ZnO and Ag–Ti tri-layer thin films prepared by multi-target magnetron sputtering von Shih, W.C., Kao, K.S., Cheng, D.L., Chung, C.J., Hsieh, P.T., Ou, S.L.

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Sputter deposition of giant magnetoresistive Co-Cu multilayers von Highmore, R.J., Shih, W.C., Somekh, R.E., Evetts, J.E.

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The effect of annealing temperature on the electrical properties of metal-ferroelectric (PbZr 0.53Ti 0.47O 3)-insulator (ZrO 2)-semiconductor (MFIS) thin-film capacitors von Juan, P.C., Jiang, J.D., Shih, W.C., Lee, J.Y.M.

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Ce K-edge EXAFS study of nanocrystalline CeO2 von Lee, J.-F, Tang, M.-T, Shih, W.C, Liu, R.S

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Transmission electron microscopy of AlCu interconnects during in-situ electromigration testing von Shih, W.C., Greer, A.L.

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Evolution of microstructure and magnetoresistance in Co/Cu multilayers during annealing von Rätzke, K, Hall, M.J, Jardine, D.B, Shih, W.C, Somekh, R.E, Greer, A.L

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The sputter deposition of precision metal multilayers von Somekh, R.E., Huang, K.H., Shih, W.C.

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Crystallization behaviour of AlSm amorphous alloys von Battezzati, L, Baricco, M, Schumacher, P, Shih, W.C, Greer, A.L

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Transmission electron microscopy of Al Cu interconnects during in-situ electromigration testing von Shih, W.C., Greer, A.L.

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The measurement of the roughness of W/Si multilayers using the Fresnel method von Shih, W.C., Stoobs, W.M.

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The use of the Fresnel method for the characterisation of a short-period strained Ge/Si multilayer: I. Measurement of the average Ge/Si volume ratio von Shih, W.C., Stobbs, W.M.

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Studies of giant magnetoresistive Co—Cu multilayers von Highmore, R.J., Somekh, R.E., Shih, W.C., McLoughlin, I.M., Evetts, J.E.

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The use of the Fresnel method for the characterisation of a short-period strained Ge/Si multilayer: II. Measurement of a layer-thickness irregularity von Shih, W.C., Stobbs, W.M.

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Microstructure-property relations in CoPd multilayers von Highmore, R.J., Shih, W.C., Somekh, R.E., Evetts, J.E.

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Cyclopeptide alkaloids. Synthetic, spectroscopic and conformational studies of phencyclopeptine model compounds von Goff, Dane, Lagarias, J. Clark, Shih, Willy C, Klein, Melvin P, Rapoport, Henry

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Cyclopeptide alkaloids. Conformational analysis of the dihydro-p-phencyclopeptine nucleus von Lagarias, J. Clark, Yokoyama, Wallace H, Bordner, Jon, Shih, Willy C, Klein, Melvin P, Rapoport, Henry

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Effects of mulberry leaves on production performance and the potential modulation of antioxidative status in laying hens von Lin, W C, Lee, M T, Chang, S C, Chang, Y L, Shih, C H, Yu, B, Lee, T T

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Enantioselective α-Benzylation of Aldehydes via Photoredox Organocatalysis von Shih, Hui-Wen, Vander Wal, Mark N., Grange, Rebecca L., MacMillan, David W. C.

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