Attenuated Total Reflection Spectra of Nitrided SiO2/Si Structures von Odzhaev, V. B., Pyatlitski, A. N., Prosolovich, V. S., Kovalchuk, N. S., Soloviev, Ya. A., Zhygulin, D. V., Shestovsky, D. V., Yankovski, Yu. N., Brinkevich, D. I.

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Influence of Structural Defects on the Electrophysical Parameters of pin-Photodiodes von Koval’chuk, N. S., Lastovskii, S. B., Odzhaev, V. B., Petlitskii, A. N., Prosolovich, V. S., Shestovsky, D. V., Yavid, V. Yu, Yankovskii, Yu. N.

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