Treffer 1 - 15 von 15 für Suche 'Shendre, Abhishek', Suchdauer: 0,47s Treffer weiter einschränken
  1. 1
    Methods and systems to classify features in electronic designs

    Methods and systems to classify features in electronic designs von Niewczas, Mariusz, Shendre, Abhishek

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  2. 2
    METHODS AND SYSTEMS TO CLASSIFY FEATURES IN ELECTRONIC DESIGNS

    METHODS AND SYSTEMS TO CLASSIFY FEATURES IN ELECTRONIC DESIGNS von SHENDRE, Abhishek, NIEWCZAS, Mariusz

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  3. 3
    METHODS AND SYSTEMS TO CLASSIFY FEATURES IN ELECTRONIC DESIGNS

    METHODS AND SYSTEMS TO CLASSIFY FEATURES IN ELECTRONIC DESIGNS von Niewczas, Mariusz, Shendre, Abhishek

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  4. 4
    Verfahren und Systeme zur Klassifizierung von Merkmalen in elektronischen Entwürfen

    Verfahren und Systeme zur Klassifizierung von Merkmalen in elektronischen Entwürfen von Abhishek Shendre, Mariusz Niewczas

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  5. 5
    Method and system of reducing charged particle beam write time

    Method and system of reducing charged particle beam write time von Pearman, Ryan, Guthrie, William E, Shirali, Nagesh, Fujimura, Akira, Shendre, Abhishek, Zable, Harold Robert

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  6. 6
    Verfahren und Systeme zur Klassifizierung von Merkmalen in elektronischen Entwürfen

    Verfahren und Systeme zur Klassifizierung von Merkmalen in elektronischen Entwürfen von Abhishek Shendre, Mariusz Niewczas

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  7. 7
    METHOD AND SYSTEM FOR DETERMINING A CHARGED PARTICLE BEAM EXPOSURE FOR A LOCAL PATTERN DENSITY

    METHOD AND SYSTEM FOR DETERMINING A CHARGED PARTICLE BEAM EXPOSURE FOR A LOCAL PATTERN DENSITY von Pearman, Ryan, Guthrie, William E, Shirali, Nagesh, Fujimura, Akira, Shendre, Abhishek, Zable, Harold Robert

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  8. 8
    Method and system for determining a charged particle beam exposure for a local pattern density

    Method and system for determining a charged particle beam exposure for a local pattern density von Pearman, Ryan, Guthrie, William E, Shirali, Nagesh, Fujimura, Akira, Shendre, Abhishek, Zable, Harold Robert

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  9. 9
    전자 설계의 피처들을 분류하기 위한 방법 및 시스템

    전자 설계의 피처들을 분류하기 위한 방법 및 시스템 von NIEWCZAS MARIUSZ, SHENDRE ABHISHEK

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  10. 10
    METHODS AND SYSTEMS TO CLASSIFY FEATURES IN ELECTRONIC DESIGNS

    METHODS AND SYSTEMS TO CLASSIFY FEATURES IN ELECTRONIC DESIGNS von NIEWCZAS MARIUSZ, SHENDRE ABHISHEK

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  11. 11
    METHOD AND SYSTEM OF REDUCING CHARGED PARTICLE BEAM WRITE TIME

    METHOD AND SYSTEM OF REDUCING CHARGED PARTICLE BEAM WRITE TIME von Pearman, Ryan, Guthrie, William E, Shirali, Nagesh, Fujimura, Akira, Shendre, Abhishek, Zable, Harold Robert

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  12. 12
    METHOD AND SYSTEM FOR DETERMINING A CHARGED PARTICLE BEAM EXPOSURE FOR A LOCAL PATTERN DENSITY

    METHOD AND SYSTEM FOR DETERMINING A CHARGED PARTICLE BEAM EXPOSURE FOR A LOCAL PATTERN DENSITY von Pearman, Ryan, Guthrie, William E, Shirali, Nagesh, Fujimura, Akira, Shendre, Abhishek, Zable, Harold Robert

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  13. 13
    Method and system of reducing charged particle beam write time

    Method and system of reducing charged particle beam write time von Pearman, Ryan, Guthrie, William E, Shirali, Nagesh, Fujimura, Akira, Shendre, Abhishek, Zable, Harold Robert

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  14. 14
    METHOD AND SYSTEM FOR DETERMINING A CHARGED PARTICLE BEAM EXPOSURE FOR A LOCAL PATTERN DENSITY

    METHOD AND SYSTEM FOR DETERMINING A CHARGED PARTICLE BEAM EXPOSURE FOR A LOCAL PATTERN DENSITY von Pearman, Ryan, Guthrie, William E, Shirali, Nagesh, Fujimura, Akira, Shendre, Abhishek, Zable, Harold Robert

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  15. 15
    METHOD AND SYSTEM OF REDUCING CHARGED PARTICLE BEAM WRITE TIME

    METHOD AND SYSTEM OF REDUCING CHARGED PARTICLE BEAM WRITE TIME von Pearman, Ryan, Guthrie, William E, Shirali, Nagesh, Fujimura, Akira, Shendre, Abhishek, Zable, Harold Robert

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