Queueing Theory for Semiconductor Manufacturing Systems: A Survey and Open Problems von Shanthikumar, J.G., Shengwei Ding, Zhang, M.T.

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Effects of capture rate and its repeatability on optimal sampling requirements in semiconductor manufacturing von Shanthikumar, J.G.

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A method for cycle time estimation of semiconductor manufacturing toolsets with correlations von Akhavan-Tabatabaei, R., Shengwei Ding, Shanthikumar, J.G.

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A Psychological Perspective on Service Segmentation Models: The Significance of Accounting for Consumers' Perceptions of Waiting and Service von Carmon, Ziv, Shanthikumar, J. George, Carmon, Tali F

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Safety Stock versus Safety Time in MRP Controlled Production Systems von Buzacott, J. A, Shanthikumar, J. G

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Stochastic Modeling for Serial-Batching Workstations with Heterogeneous Machines von Shengwei Ding, Akhavan-Tabatabaei, R., Shanthikumar, J.G.

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A general software reliability model for performance prediction von Shanthikumar, J.G.

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Improving the deployment of inspection tools; tutorial on inspection capacity and sample planning von Gudmundsson, D., Shanthikumar, J.G.

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Integrated process and inspection/metrology capacity planning von Gudmundsson, D., Shanthikumar, J.G.

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Fabless-foundry partnership: models and analysis of coordination issues von Chatterjee, A., Gudmundsson, D., Nurani, R.K., Seshadri, S., Shanthikumar, J.G.

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Linear control rules for production control of semiconductor fabs von Glassey, C.R., Shanthikumar, J.G., Seshadri, S.

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Scheduling n jobs on one machine to minimize the maximum tardiness with minimum number von Shanthikumar, J.G.

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Second-order stochastic properties in queueing systems von Shanthikumar, J.G., Yao, D.D.

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Empirical results on the relationship between die yield and cycle time in semiconductor wafer fabrication von Cunningham, S.P., Shanthikumar, J.G.

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Parametric Schur Convexity and Arrangement Monotonicity Properties of Partial Sums von Shaked, M., Shanthikumar, J.G., Tong, Y.L.

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Optimized sample planning for wafer defect inspection von Williams, R., Gudmundsson, D., Monahan, K., Shanthikumar, J.G.

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Stochastic convexity for multidimensional processes and its applications von Chang, C.-S., Chao, X., Pinedo, M., Shanthikumar, J.G.

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Challenging the paradigm of monitor reduction to achieve lower product costs von Williams, R., Gudmundsson, D., Nurani, R., Stoller, M., Chatterjee, A., Seshadri, S., Shanthikumar, J.G.

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Bounding network-reliability using consecutive minimal cutsets von Shanthikumar, J.G.

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A Comment On The Paper "An Optimal Solution For Scheduling Of Printing And Binding" von Shanthikumar, J.G.

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