Toward a New Mathematical Definition of Datums in Standards to Support Advanced Manufacturing von Shakarji, Craig M., Srinivasan, Vijay

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Optimality Conditions for Constrained Least-Squares Fitting of Circles, Cylinders, and Spheres to Establish Datums von Shakarji, Craig M, Srinivasan, Vijay

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On Algorithms and Heuristics for Constrained Least-Squares Fitting of Circles and Spheres to Support Standards von Shakarji, Craig M, Srinivasan, Vijay

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Convexity and Optimality Conditions for Constrained Least-Squares Fitting of Planes and Parallel Planes to Establish Datums von Shakarji, Craig M, Srinivasan, Vijay

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Datum Planes Based on a Constrained L1 Norm von Shakarji, Craig M, Srinivasan, Vijay

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Theory and Algorithms for Weighted Total Least-Squares Fitting of Lines, Planes, and Parallel Planes to Support Tolerancing Standards von Shakarji, Craig M, Srinivasan, Vijay

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A Brief Analysis of Recent ISO Tolerancing Standards and Their Potential Impact on Digitization of Manufacturing von Morse, Edward P., Shakarji, Craig M., Srinivasan, Vijay

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Least-Squares Fitting Algorithms of the NIST Algorithm Testing System von Shakarji, Craig M

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On the Enduring Appeal of Least-Squares Fitting in Computational Coordinate Metrology von Srinivasan, Vijay, Shakarji, Craig M, Morse, Edward P

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Constrained Least-Squares Fitting for Tolerancing and Metrology von Shakarji, Craig M., Srinivasan, Vijay

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RECIST versus volume measurement in medical CT using ellipsoids of known size von Levine, Zachary H, Borchardt, Bruce R, Brandenburg, Nolan J, Clark, Charles W, Muralikrishnan, Bala, Shakarji, Craig M, Chen, Joseph J, Siegel, Eliot L

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Theory and Algorithm for Planar Datum Establishment Using Constrained Total Least-squares von Shakarji, Craig M., Srinivasan, Vijay

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Datum Planes Based on a Constrained L sub(1) Norm von Shakarji, Craig M, Srinivasan, Vijay

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The 2016 Revision of ISO 1 - Standard Reference Temperature for the Specification of Geometrical and Dimensional Properties von Phillips, S D, Shakarji, C M, Balsamo, A, Krystek, M, Morse, E

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Information Technology Measurement and Testing Activities at NIST von Hogan, M D, Carnahan, L J, Carpenter, R J, Flater, D W, Fowler, J E, Frechette, S P, Gray, M M, Johnson, L A, McCabe, R M, Montgomery, D, Radack, S M, Rosenthal, R, Shakarji, C M

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Managing CMM Software Uncertainties von Shakarji, Craig M, Raffaldi, John

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Managing CMM software uncertainties: standards help manage software's contribution to CMM measurement uncertainty von Shakarji, Craig M, Raffaldi, John

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