Electronic structure and charge transport properties of amorphous Ta2O5 films von Shvets, V.A., Aliev, V.Sh, Gritsenko, D.V., Shaimeev, S.S., Fedosenko, E.V., Rykhlitski, S.V., Atuchin, V.V., Gritsenko, V.A., Tapilin, V.M., Wong, H.

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Wigner crystallization of electrons in deep traps in a two-dimensional dielectric von Shaimeev, S. S., Gritsenko, V. A.

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Electronic structure and charge transport properties of amorphous Ta 2O 5 films von Shvets, V.A., Aliev, V.Sh, Gritsenko, D.V., Shaimeev, S.S., Fedosenko, E.V., Rykhlitski, S.V., Atuchin, V.V., Gritsenko, V.A., Tapilin, V.M., Wong, H.

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DLTS study of oxygen precipitates in silicon annealed at high pressure von Antonova, I.V., Misiuk, A., Popov, V.P., Fedina, L.I., Shaimeev, S.S.

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DLTS study of nucleation stage of oxygen precipitate in silicon von Antonova, I.V, Popov, V.P, Shaimeev, S.S

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