Focusing with saw‐tooth refractive lenses at a high‐energy X‐ray beamline von Shastri, S. D., Kenesei, P., Mashayekhi, A., Shade, P. A

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Accuracy and precision of near‐field high‐energy diffraction microscopy forward‐model‐based microstructure reconstructions von Menasche, D. B., Shade, P. A., Suter, R. M.

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Analysis of genes (TMEM106B, GRN, ABCC9, KCNMB2, and APOE) implicated in risk for LATE-NC and hippocampal sclerosis provides pathogenetic insights: a retrospective genetic associat... von Dugan, Adam J, Nelson, Peter T, Katsumata, Yuriko, Shade, Lincoln M P, Boehme, Kevin L, Teylan, Merilee A, Cykowski, Matthew D, Mukherjee, Shubhabrata, Kauwe, John S K, Hohman, Timothy J, Schneider, Julie A, Fardo, David W

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A combined experimental and simulation study to examine lateral constraint effects on microcompression of single-slip oriented single crystals von Shade, P.A., Wheeler, R., Choi, Y.S., Uchic, M.D., Dimiduk, D.M., Fraser, H.L.

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Brain arteriolosclerosis von Blevins, Brittney L., Vinters, Harry V., Love, Seth, Wilcock, Donna M., Grinberg, Lea T., Schneider, Julie A., Kalaria, Rajesh N., Katsumata, Yuriko, Gold, Brian T., Wang, Danny J. J., Ma, Samantha J., Shade, Lincoln M. P., Fardo, David W., Hartz, Anika M. S., Jicha, Gregory A., Nelson, Karin B., Magaki, Shino D., Schmitt, Frederick A., Teylan, Merilee A., Ighodaro, Eseosa T., Phe, Panhavuth, Abner, Erin L., Cykowski, Matthew D., Van Eldik, Linda J., Nelson, Peter T.

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Demonstration of an in situ microscale fatigue testing technique on a titanium alloy von Szczepanski, C.J., Jha, S.K., Shade, P.A., Wheeler, R., Larsen, J.M.

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A New Residual Strain Mapping Program Using Energy Dispersive X-Ray Diffraction at the Advanced Photon Source von Park, J.-S., Chuang, A.C., Okasinski, J., Chen, H., Shade, P., Turner, T.J., Stock, S., Almer, J.

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Size-affected single-slip behavior of René N5 microcrystals von Shade, P.A., Uchic, M.D., Dimiduk, D.M., Viswanathan, G.B., Wheeler, R., Fraser, H.L.

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The influence of microstructure on surface strain distributions in a nickel micro-tension specimen von Turner, T J, Shade, P A, Schuren, J C, Groeber, M A

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Dissolution of the Alpha Phase in Ti-6Al-4V During Isothermal and Continuous Heat Treatment von Semiatin, S. L., Obstalecki, M., Payton, E. J., Pilchak, A. L., Shade, P. A., Levkulich, N. C., Shank, J. M., Pagan, D. C., Zhang, F., Tiley, J. S.

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Intermittent plasticity in individual grains: A study using high energy x-ray diffraction von Chatterjee, K., Beaudoin, A. J., Pagan, D. C., Shade, P. A., Philipp, H. T., Tate, M. W., Gruner, S. M., Kenesei, P., Park, J.-S.

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Bright x-rays reveal shifting deformation states and effects of the microstructure on the plastic deformation of crystalline materials von Beaudoin, A. J., Shade, P. A., Schuren, J. C., Turner, T. J., Woodward, C., Bernier, J. V., Li, S. F., Dimiduk, D. M., Kenesei, P., Park, J.-S.

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Insights Gained Through Image Analysis During In Situ Micromechanical Experiments von Wheeler, R., Shade, P. A., Uchic, M. D.

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3D reconstruction of prior β grains in friction stir–processed Ti–6Al–4V von TILEY, J.S., SHIVELEY, A.R., PILCHAK, A.L., SHADE, P.A., GROEBER, M.A.

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A novel method for acquiring large‐scale automated scanning electron microscope data von SHIVELEY, A.R., SHADE, P.A., PILCHAK, A.L., TILEY, J.S., KERNS, R.

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Thermal conductivity measurement at micrometer length scales based on a temperature-balance method von Ganguli, S, Wheeler, R, Sihn, S, Shade, P, Roy, A K

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Programming for Microscopy and Microanalysis von Shade, P., Uchic, M., Shiveley, A., Groeber, M.

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Correlative characterization of the local deformation response and gage volume microstructure of pure Ni micro-samples via in-situ SEM testing and 3D EBSD von Shade, P., Groeber, M., Uchic, M., Wheeler, R.

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Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer von Hu, J. J., Wheeler, R., Zabinski, J. S., Shade, P. A., Shiveley, A., Voevodin, A. A.

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Using cross-correlation for automated stitching of two-dimensional multi-tile electron backscatter diffraction data von PILCHAK, A.L., SHIVELEY, A.R., SHADE, P.A., TILEY, J.S., BALLARD, D.L.

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