Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment von Colombi, P., Agnihotri, D. K., Asadchikov, V. E., Bontempi, E., Bowen, D. K., Chang, C. H., Depero, L. E., Farnworth, M., Fujimoto, T., Gibaud, A., Jergel, M., Krumrey, M., Lafford, T. A., Lamperti, A., Ma, T., Matyi, R. J., Meduna, M., Milita, S., Sakurai, K., Shabel'nikov, L., Ulyanenkov, A., Van der Lee, A., Wiemer, C.

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Kinoform X-ray lens creation in polymer materials by deep X-ray lithography von Nazmov, V, Shabel'nikov, L, Pantenburg, F.-J, Mohr, J, Reznikova, E, Snigirev, A, Snigireva, I, Kouznetsov, S, DiMichiel, M

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Recent advances in X-ray refractive optics von Aristov, V V, Shabel'nikov, L G

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Tungsten thin-film deposition on a silicon wafer: The formation of silicides at W-Si interface von Plyushcheva, S. V., Mikhailov, G. M., Shabel’nikov, L. G., Shapoval, S. Yu

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Short-focus silicon parabolic lenses for hard X-rays von Aristov, V.V., Starkov, V.V., Shabel'nikov, L.G., Kuznetsov, S.M., Ushakova, A.P., Grigoriev, M.V., Tseitlin, V.M.

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X-ray refractive planar lens with minimized absorption von Aristov, V., Grigoriev, M., Kuznetsov, S., Shabelnikov, L., Yunkin, V., Weitkamp, T., Rau, C., Snigireva, I., Snigirev, A., Hoffmann, M., Voges, E.

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Investigation into the formation of X-ray photopolymer lenses von Sagdullin, T. A., Shabel’nikov, L. G., Irzhak, D. V.

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Taking into account channels of focused intensity losses for refractive optics elements von Shabel’nikov, L. G.

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Intrinsic symmetry of refracting profiles derived from a parabola von Aristov, V. V., Shabel’nikov, L. G.

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X-ray focusing by planar parabolic refractive lenses made of silicon von Aristov, V.V, Grigoriev, M.V, Kuznetsov, S.M, Shabelnikov, L.G, Yunkin, V.A, Hoffmann, M, Voges, E

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Refractive X-ray lenses with rotation profile and curvature-radius scale reduction von Aristov, V. V., Shabel’nikov, L. G., Shabel’nikova, Ya. L., Sagdullin, T. A., Panchenko, V. Ya, Evseev, A. V., Novikov, M. M., Asadchikov, V. E., Buzmakov, A. V.

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Holographic X-ray optical elements: transition between refraction and diffraction von Snigireva, I., Snigirev, A., Rau, C., Weitkamp, T., Aristov, V., Grigoriev, M., Kuznetsov, S., Shabelnikov, L., Yunkin, V., Hoffmann, M., Voges, E.

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"Reproducability in X-Ray reflectometry : results from the first reflectivity round robin" von Agnihotri, D.K., Asadchikov, V.E., Bontempi, E., Bowen, D.K., Chang, C.H., Colombi, P., Depero, L.E., Farnworth, M., Fujimoto, T., Gibaud, Alain, Jergel, M., Krumrey, M., Lafford, T.A., Lamperti, A., Ma, T., Matyi, R.J., Meduna, M., Milita, S., Oliviero, G., Sakurai, K., Shabel'Nikov, L., Ulyanenkov, A., van Der Lee, A., Wiemer, C.

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Hard x-ray imaging using free-standing spherically bent crystals von Faenov, A. Ya, Pikuz, T. A., Avrutin, V., Izyumskaya, N., Shabelnikov, L., Shulakov, E., Kyrala, G. A.

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Silicon planar refractive lenses with the optimized design von Aristov, V., Grigoriev, M., Kuznetsov, S., Shabelnikov, L., Yunkin, V., Rau, C., Snigirev, A., Snigireva, I., Weitkamp, T., Hoffmann, M., Voges, E.

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X-ray standing wave microscopy: Chemical microanalysis with atomic resolution von Drakopoulos, Michael, Zegenhagen, Jörg, Snigirev, Anatoly, Snigireva, Irina, Hauser, Maik, Eberl, Karl, Aristov, Vitalii, Shabelnikov, Leonid, Yunkin, Vecheslav

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Diamond refractive lens for X-ray focusing von Snigirev, A., Snigireva, I., Kuznetsov, S., Drakopoulos, M., Di Michiel, M., Dolbnya, I., Shabel'nikov, L., Yunkin, V., Ralchenko, V., Sychov, I., Hoffmann, M., Voges, E.

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Short-focus silicon parabolic lenses for hard X-rays von ARISTOV, V. V, STARKOV, V. V, SHABEL'NIKOV, L. G, KUZNETSOV, S. M, USHAKOVA, A. P, GRIGORIEV, M. V, TSEITLIN, V. M

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X-ray diffractometry of thin films using synchrotron radiation beams von Shabelnikov, L.G., Zuev, A.P.

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The analysis of microtomography optical schemes von Aristov, V.V., Shabelnikov, L.G.

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