Mechanism of degradation of LDD MOSFETs due to hot-electron stress von Bhattacharyya, A., Shabde, S.N.

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Channel-width dependence of the punchthrough characteristics in n-channel MOSFETS von Shabde, Sunil N.

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Degradation of short-channel MOSFET's under constant current stress across gate and drain von Bhattacharyya, A., Shabde, S.N.

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Channel-length dependence of substrate current characteristic of LDD MOSFET's von Shabde, S.N., Barman, F., Bhattacharyya, A.

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The effects of constant-current stress on gate oxides in LDD MOSFET's von Bhattacharyya, A., Shabde, S.N., Barman, F., Muller, R.S.

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Method of determining the doping concentration across a surface of a semiconductor material von Shabde, Sunil N, Liu, Yowjuang William, Tsui, Ting Yiu

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Method of determining the doping concentration across a surface of a semiconductor material von TSUI TING YIU, LIU YOWJUANG WILLIAM, SHABDE SUNIL N

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Method of determining the doping concentration and defect profile across a surface of a processed semiconductor material von TSUI TING YIU, LIU YOWJUANG WILLIAM, SHABDE SUNIL N

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Method of determining the doping concentration across a surface of a semiconductor material von TSUI TING YIU, LIU YOWJUANG WILLIAM, SHABDE SUNIL N

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Method of determining the doping concentration across a surface of a semiconductor material von TSUI TING YIU, LIU YOWJUANG WILLIAM, SHABDE SUNIL N

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System and method for detecting defects in an interlayer dielectric of a semiconductor device using the hall-effect von TSUI TING YIU, LIU YOWJUANG WILLIAM, SHABDE SUNIL N

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System and method of mapping leakage current and a defect profile of a semiconductor dielectric layer von TSUI, TING YIU, SHABDE, SUNIL N, LIU, YOWJUANG WILLIAM

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Arsenic Diffusion Through Thin Oxides von Shabde, Sunil N., Helliwell, Kim

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System and method for detecting defects in an interlayer dielectric of a semiconductor device von TSUI, TING YIU, SHABDE, SUNIL N, LIU, YOWJUANG WILLIAM

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Method for electronically measuring size of internal void in electrically conductive lead von JOO YOUNGANG, YIU TSUI TING, LIU YOW JUANG W, SHABDE SUNIL N

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