Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces von Gurbán, S., Petrik, P., Serényi, M., Sulyok, A, Menyhárd, M., Baradács, E., Parditka, B., Cserháti, C., Langer, G. A., Erdélyi, Z.

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Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy von Serenyi, M., Lohner, T., Petrik, P., Frigeri, C.

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On the mechanisms of hydrogen-induced blistering in RF-sputtered amorphous Ge von Serényi, M, Frigeri, C, Csik, A, Khánh, N. Q, Németh, A, Zolnai, Z

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Diffusion and reaction kinetics governing surface blistering in radio frequency sputtered hydrogenated a-SixGe1-x (0 ≤ x ≤ 1) thin films von Serényi, M., Csík, A., Hámori, A., Kalas, B., Lukács, I., Zolnai, Z.S., Frigeri, C.

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Effect of heat treatments on the properties of hydrogenated amorphous silicon for PV and PVT applications von Frigeri, C., Serényi, M., Szekrényes, Zs, Kamarás, K., Csik, A., Khánh, N.Q.

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Comparison in formation, optical properties and applicability of DC magnetron and RF sputtered aluminum oxide films von Serényi, M., Lohner, T., Sáfrán, G., Szívós, J.

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Acceleration of cold Rb atoms by frequency modulated light pulses von BAKOS, J. S, DJOTYAN, G. P, IGNHCZ, P. N, KEDVES, M. A, SERENYI, M, SÖRLEI, Zs, SZIGETI, J, TOTH, Z

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Evolution of the structure and hydrogen bonding configuration in annealed hydrogenated a-Si/a-Ge multilayers and layers von Frigeri, C., Serényi, M., Csik, A., Szekrényes, Zs, Kamarás, K., Nasi, L., Khánh, N.Q.

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Hydrogen behaviour in amorphous Si/Ge nano-structures after annealing von Frigeri, C., Serényi, M., Khánh, N.Q., Csik, A., Nasi, L., Erdélyi, Z., Beke, D.L., Boyen, H.-G.

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Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction von Serényi, M., Lohner, T., Petrik, P., Zolnai, Z., Horváth, Z.E., Khánh, N.Q.

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Determination of hydrogen concentration in a-Si and a-Ge layers by elastic recoil detection analysis von Khánh, N.Q., Serényi, M., Csik, A., Frigeri, C.

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Nanopattern formation in UV laser treated a-AlOx and nc-Al/AlOx layers von Szívós, János, Serényi, M., Gergely-Fülöp, E., Lohner, T., Sáfrán, G.

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Fabrication of Nanopatterns in a-AlOx Thin Films by a Single Laser Pulse von Szívós, Janos, Serenyi, M, Gergely-Fülöp, E, Safran, G

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Fabrication of Nanopatterns in a-AlO sub(x) Thin Films by a Single Laser Pulse von Szivos, Janos, Serenyi, M, Gergely-Fulop, E, Safran, G

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Investigation of silicon oxynitride and amorphous silicon multilayers von Serenyi, M., Frigeri, C.

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Structural modifications induced in hydrogenated amorphous Si/Ge multilayers by heat treatments von Frigeri, C., Serényi, M., Csik, A., Erdélyi, Z., Beke, D. L., Nasi, L.

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Refractive index of sputtered silicon oxynitride layers for antireflection coating von Serényi, M, Rácz, M, Lohner, T

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Hydrogen release in annealed hydrogenated a-Si/a-Ge multilayers von Frigeri, C., Serényi, M., Khánh, N. Q., Csik, A., Erdélyi, Z., Nasi, L., Beke, D. L., Boyen, H.-G.

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Modification of Al/Si interface and Schottky barrier height with chemical treatment von Horváth, Zs.J., Ádám, M., Szabó, I., Serényi, M., Van Tuyen, Vo

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Interaction of frequency modulated light pulses with rubidium atoms in a magneto-optical trap von BAKOS, J. S, DJOTYAN, G. P, IGNACZ, P. N, KEDVES, M. A, SERENYI, M, SÖRLEI, Zs, SZIGETI, J, TOTH, Z

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