Weighted dynamic time warping for time series classification von Jeong, Young-Seon, Jeong, Myong K., Omitaomu, Olufemi A.

Volltext

Online-SVR for short-term traffic flow prediction under typical and atypical traffic conditions von Castro-Neto, Manoel, Jeong, Young-Seon, Jeong, Myong-Kee, Han, Lee D.

Volltext

Cluster Validity Index for Uncertain Data Based on a Probabilistic Distance Measure in Feature Space von Ko, Changwan, Baek, Jaeseung, Tavakkol, Behnam, Jeong, Young-Seon

Volltext

Supervised Weighting-Online Learning Algorithm for Short-Term Traffic Flow Prediction von Young-Seon Jeong, Young-Ji Byon, Mendonca Castro-Neto, Manoel, Easa, Said M.

Volltext

A generalised uncertain decision tree for defect classification of multiple wafer maps von Kim, Byunghoon, Jeong, Young-Seon, Tong, Seung Hoon, Jeong, Myong K.

Volltext

True sparse PCA for reducing the number of essential sensors in virtual metrology von Xie, Yifan, Wang, Tianhui, Jeong, Young-Seon, Tosyali, Ali, Jeong, Myong K.

Volltext

Orthogonal binary singular value decomposition method for automated windshield wiper fault detection von Alhindi, Taha J., Baek, Jaeseung, Jeong, Young-Seon, Jeong, Myong K.

Volltext

Norm ball classifier for one-class classification von Kim, Sehwa, Lee, Kyungsik, Jeong, Young-Seon

Volltext

New multivariate kernel density estimator for uncertain data classification von Kim, Byunghoon, Jeong, Young-Seon, Jeong, Myong K.

Volltext

Intelligent Multi-Sensor Detection System for Monitoring Indoor Building Fires von Baek, Jaeseung, Alhindi, Taha J., Jeong, Young-Seon, Jeong, Myong K., Seo, Seongho, Kang, Jongseok, Heo, Yoseob

Volltext

Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps von Adly, Fatima, Alhussein, Omar, Yoo, Paul D., Al-Hammadi, Yousof, Taha, Kamal, Muhaidat, Sami, Young-Seon Jeong, Uihyoung Lee, Ismail, Mohammed

Volltext

Real-Time Fire Detection Algorithm Based on Support Vector Machine with Dynamic Time Warping Kernel Function von Baek, Jaeseung, Alhindi, Taha J., Jeong, Young-Seon, Jeong, Myong K., Seo, Seongho, Kang, Jongseok, Choi, Jaekyung, Chung, Hyunsang

Volltext

Statistical process control procedures for functional data with systematic local variations von Jeong, Young-Seon, Jeong, Myong K., Lu, Jye-Chyi, Yuan, Ming, Jin, Jionghua (Judy)

Volltext

A Regularized Singular Value Decomposition-Based Approach for Failure Pattern Classification on Fail Bit Map in a DRAM Wafer von Byunghoon Kim, Young-Seon Jeong, Seung Hoon Tong, In-Kap Chang, Myong-Kee Jeongyoung

Volltext

Automatic Identification of Defect Patterns in Semiconductor Wafer Maps Using Spatial Correlogram and Dynamic Time Warping von Young-Seon Jeong, Seong-Jun Kim, Jeong, M.K.

Volltext

A New Feature Selection Method for One-Class Classification Problems von JEONG, Young-Seon, KANG, In-Ho, JEONG, Myong-Kee, KONG, Dongjoon

Volltext

Dynamic sparse PCA: a dimensional reduction method for sensor data in virtual metrology von Wang, Tianhui, Xie, Yifan, Jeong, Young-Seon, Jeong, Myong K.

Volltext

A Hybrid Recommendation Method with Reduced Data for Large-Scale Application von Sang Hyun Choi, Young-Seon Jeong, Jeong, Myong K

Volltext

Step-Down Spatial Randomness Test for Detecting Abnormalities in DRAM Wafers with Multiple Spatial Maps von Kim, Byunghoon, Jeong, Young-Seon, Tong, Seung Hoon, Chang, In-Kap, Jeong, Myong-Kee

Volltext