Atomic scale mechanism of β to γ phase transformation in gallium oxide von Huang, Hsien-Lien, Johnson, Jared M., Chae, Christopher, Senckowski, Alexander, Wong, Man Hoi, Hwang, Jinwoo

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Room-Temperature (RT) Extended Short-Wave Infrared (e-SWIR) Avalanche Photodiode (APD) with a 2.6 µm Cutoff Wavelength von Benker, Michael, Gu, Guiru, Senckowski, Alexander Z, Xiang, Boyang, Dwyer, Charles H, Adams, Robert J, Xie, Yuanchang, Nagarajan, Ramaswamy, Li, Yifei, Lu, Xuejun

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Atomic scale defect formation and phase transformation in Si implanted β-Ga2O3 von Huang, Hsien-Lien, Chae, Christopher, Johnson, Jared M., Senckowski, Alexander, Sharma, Shivam, Singisetti, Uttam, Wong, Man Hoi, Hwang, Jinwoo

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Comprehensive characterization of nitrogen-related defect states in β-Ga2O3 using quantitative optical and thermal defect spectroscopy methods von Ghadi, Hemant, Cornuelle, Evan, Mcglone, Joe F., Senckowski, Alexander, Sharma, Shivam, Wong, Man Hoi, Singisetti, Uttam, Ringel, Steven A.

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Identification and characterization of deep nitrogen acceptors in β-Ga2O3 using defect spectroscopies von Ghadi, Hemant, McGlone, Joe F., Cornuelle, Evan, Senckowski, Alexander, Sharma, Shivam, Wong, Man Hoi, Singisetti, Uttam, Frodason, Ymir Kalmann, Peelaers, Hartwin, Lyons, John L., Varley, Joel B., Van de Walle, Chris G., Arehart, Aaron, Ringel, Steven A.

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Room-Temperature with a 2.6 µm Cutoff Wavelength von Benker, Michael, Gu, Guiru, Senckowski, Alexander Z, Xiang, Boyang, Dwyer, Charles H, Adams, Robert J, Xie, Yuanchang, Nagarajan, Ramaswamy, Li, Yifei, Lu, Xuejun

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ELECTRONIC POSITION SENSING SYSTEM, METHOD, AND APPARATUS von Armiento, Craig A, Kingsley, Edward D, Senckowski, Alexander Z, Homan, Kyle M, Musoke, David, Akyurtlu, Alkim

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ELECTRONIC POSITION SENSING SYSTEM, METHOD, AND APPARATUS von HOMAN, Kyle M, SENCKOWSKI, Alexander Z, AKYURTLU, Alkim, ARMIENTO, Craig A, MUSOKE, David, KINGSLEY, Edward D

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