Picosecond ultrasonics study of the modification of interfacial bonding by ion implantation von Tas, G., Loomis, J. J., Maris, H. J., Bailes, A. A., Seiberling, L. E.

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Dimer elongation on the monohydride-covered Ge/Si(100) surface von Bailes, A.A, Boshart, M.A, Seiberling, L.E

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Experimental test of the single adatom exchange model in surfactant-mediated growth of Ge on Si(100) von Bailes, A.A., Boshart, M.A., Seiberling, L.E.

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A channeled ion energy loss study of the surfactant-mediated growth of Ge on Si(100) von Boshart, M.A., Bailes, A.A., Seiberling, L.E.

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SiH and CH bond breaking during MeV-ion bombardment of a native oxide of silicon von Seiberling, L.E.

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Dimer formation in monolayer antimony films deposited at room temperature on Si(100)−2 × 1 von Grant, M.W., Lyman, P.F., Hoogenraad, J.H., Seiberling, L.E.

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Energy loss distributions for 625 keV H + ions channeled near the 〈100〉 axis in silicon von Dygo, A., Boshart, M.A., Grant, M.W., Seiberling, L.E.

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Asymmetric Sb dimers on the 1 ML Ge-terminated Si(100) surface von Grant, M.W., Boshart, M.A., Dieleman, D.J., Seiberling, L.E.

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Low temperature pseudomorphic growth of Ge on Si(100)-(2 × 1) von Lyman, P.F., Thevuthasan, S., Seiberling, L.E.

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Energy-loss distributions for 2. 5-MeV He[sup +] ions incident on Si single crystals von Boshart, M.A., Dygo, A., Seiberling, L.E.

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A UHV-compatible ΔE− E gas telescope for depth profiling and surface analysis of light elements von Behrooz, A.M., Headrick, R.L., Seiberling, L.E., Zurmühle, R.W.

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PIXE analysis of GaAs and ZnSe von Reid, I., Seiberling, L.E., Van Rinsvelt, H.A.

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Non-registered silicon produced at a metal-silicon interface by 14 MeV oxygen ions von HEADRICK, R. L, SEIBERLING, L. E

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Impact-parameter dependence of energy loss for 625-keV H+ ions in Si single crystals von Dygo, A, Boshart, MA, Seiberling, LE, Kabachnik, NM

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Anomalous sputtering at high energy von Haff, P.K., Seiberling, L.E.

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Dimer formation in monolayer antimony films deposited at room temperature on Si(100)-2×1 von Grant, M.W., Lyman, P.F., Hoogenraad, J.H., Seiberling, L.E.

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