Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS von Lee, J.L.S., Gilmore, I.S., Fletcher, I.W., Seah, M.P.

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The matrix effect in secondary ion mass spectrometry von Seah, M.P., Shard, A.G.

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Identification of complex molecules at surfaces: G-SIMS and SMILES fragmentation pathways von Green, F.M., Dell, E.J., Gilmore, I.S., Seah, M.P.

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Electron flood gun damage in the analysis of polymers and organics in time-of-flight SIMS von Gilmore, I.S., Seah, M.P.

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Static SIMS: towards unfragmented mass spectra — the G-SIMS procedure von Gilmore, I.S, Seah, M.P

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Analytic function to describe interfaces and resolution consistency in sputter depth profiling von Seah, M.P.

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Investigating the difficulty of eliminating flood gun damage in TOF-SIMS von Gilmore, I.S, Seah, M.P

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Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined von Seah, M.P

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Quantitative AES and XPS: convergence between theory and experimental databases von Seah, M.P.

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An accurate semi-empirical equation for sputtering yields, II: for neon, argon and xenon ions von Seah, M.P.

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Validation and accuracy of software for peak synthesis in XPS von Seah, M.P., Brown, M.T.

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AES: energy calibration of electron spectrometers. IV. A re-evaluation of the reference energies von Seah, M.P.

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Erratum to “An accurate semi-empirical equation for sputtering yields, II: for neon, argon and xenon ions” [Nucl. Instr. and Meth. B 229 (2005) 348–358] von Seah, M.P.

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TOF-SIMS: Accurate Mass Scale Calibration von Green, F.M., Gilmore, I.S., Seah, M.P.

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Quantitative XPS: I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database von Seah, M.P, Gilmore, I.S, Spencer, S.J

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Artifacts in the sputtering of inorganics by C60n von Lee, J.L.S., Seah, M.P., Gilmore, I.S.

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Ion detection efficiency in SIMS:: Dependencies on energy, mass and composition for microchannel plates used in mass spectrometry von Gilmore, I.S, Seah, M.P

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Channel electron multipliers: quantitative intensity measurement—efficiency, gain, linearity and bias effects von Seah, M.P.

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Artifacts in the sputtering of inorganics by C 60 n von Lee, J.L.S., Seah, M.P., Gilmore, I.S.

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G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptides von Green, F.M., Gilmore, I.S., Seah, M.P.

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