Analytic function to describe interfaces and resolution consistency in sputter depth profiling von Seah, M.P.

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The matrix effect in secondary ion mass spectrometry von Seah, M.P., Shard, A.G.

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An accurate semi-empirical equation for sputtering yields, II: for neon, argon and xenon ions von Seah, M.P.

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Static SIMS: towards unfragmented mass spectra — the G-SIMS procedure von Gilmore, I.S, Seah, M.P

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Background subtraction: I. General behaviour of Tougaard-style backgrounds in AES and XPS von Seah, M.P.

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Quantitative AES and XPS: convergence between theory and experimental databases von Seah, M.P.

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Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS von Lee, J.L.S., Gilmore, I.S., Fletcher, I.W., Seah, M.P.

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Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined von Seah, M.P

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AES: energy calibration of electron spectrometers. IV. A re-evaluation of the reference energies von Seah, M.P.

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Identification of complex molecules at surfaces: G-SIMS and SMILES fragmentation pathways von Green, F.M., Dell, E.J., Gilmore, I.S., Seah, M.P.

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Electron flood gun damage in the analysis of polymers and organics in time-of-flight SIMS von Gilmore, I.S., Seah, M.P.

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Background subtraction III: The application of REELS data to background removal in AES and XPS von Seah, M.P.

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Static SIMS: metastable decay and peak intensities von Gilmore, I.S, Seah, M.P

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A system for the intensity calibration of electron spectrometers von Seah, M.P.

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Validation and accuracy of peak synthesis software for XPS von Seah, M.P, Brown, M.T

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Static SIMS: ion detection efficiencies in a channel electron multiplier von Gilmore, I.S, Seah, M.P

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Repeatable intensity calibration of an X-ray photoelectron spectrometer von Seah, M.P., Spencer, S.J.

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Reply to “comment of M.P. Seah and P.J. Cumpson on ‘spectral noise removal by digital filtering and its application to surface analysis’ by K. Piyakis and E. Sacher” von Piyakis, K., Sacher, E.

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Investigating the difficulty of eliminating flood gun damage in TOF-SIMS von Gilmore, I.S, Seah, M.P

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Quantitative XPS: I. Analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database von Seah, M.P, Gilmore, I.S, Spencer, S.J

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