Charge-Exchange Spectra of Hydrogenic and He-like Iron von Wargelin, B. J, Beiersdorfer, P, Neill, P. A, Olson, R. E, Scofield, J. H

Volltext

Plasmas with an index of refraction greater than 1 von NILSEN, Joseph, SCOFIELD, James H

Volltext

Observation of a multiply ionized plasma with index of refraction greater than one von FILEVICH, J, ROCCA, J. J, SHLYAPTSEV, V. N, MARCONI, M. C, MOON, S. J, NILSEN, J, SCOFIELD, J. H, DUNN, J, SMITH, R. F, KEENAN, R, HUNTER, J. R

Volltext

Sputtered molybdenum bilayer back contact for copper indium diselenide-based polycrystalline thin-film solar cells von Scofield, John H., Duda, A., Albin, D., Ballard, B.L., Predecki, P.K.

Volltext

X-ray-line diagnostic of magnetic field strength for high-temperature plasmas von Beiersdorfer, P, Scofield, J H, Osterheld, A L

Volltext

Temperature-independent switching rates for a random telegraph signal in a silicon metal–oxide–semiconductor field-effect transistor at low temperatures von Scofield, John H., Borland, Nick, Fleetwood, D. M.

Volltext

Impact of anomalous dispersion on the interferometer measurements of plasmas von Nilsen, Joseph, Johnson, Walter R., Iglesias, Carlos A., Scofield, James H.

Volltext

Excitation Cross Section Measurement for n = 3 to n = 2 Line Emission in Fe20+ to Fe23 von Chen, H, Beiersdorfer, P, Scofield, J. H, Brown, G. V, Boyce, K. R, Kelley, R. L, Kilbourne, C. A, Porter, F. S, Gu, M. F, Kahn, S. M

Volltext

Effects of series resistance and inductance on solar cell admittance measurements von Scofield, John H.

Volltext

Measurement of electron impact collisional excitation cross sections of Ni to Ga-Like Gold von May, M.J., Beiersdorfer, P., Jordan, N., Scofield, J.H., Reed, K.J., Hansen, S.B., Fournier, K.B., Gu, M.F., Brown, G.V., Porter, F.S., Kelley, R., Kilbourne, C.A., Boyce, K.R.

Volltext

ac method for measuring low‐frequency resistance fluctuation spectra von Scofield, John H.

Volltext

Observation of interference between dielectronic recombination and radiative recombination in highly charged uranium ions von Knapp, DA, Beiersdorfer, P, Chen, MH, Scofield, JH, Schneider, D

Volltext

Reconciliation of different gate-voltage dependencies of 1/f noise in n-MOS and p-MOS transistors von Scofield, J.H., Borland, N., Fleetwood, D.M.

Volltext

Measurement of Emission Cross Sections for n = 3 → 2 Lines in Li-like Fe23 von Chen, H, Beiersdorfer, P, Scofield, J. H, Gendreau, K. C, Boyce, K. R, Brown, G. V, Kelley, R. L, Porter, F. S, Stahle, C. K, Szymkowiak, A. E, Kahn, S. M

Volltext

Observation of multiply ionized plasmas with dominant bound electron contribution to the index of refraction von Filevich, J., Rocca, J.J., Marconi, M.C., Moon, S.J., Nilsen, J., Scofield, J.H., Dunn, J., Smith, R.F., Keenan, R., Hunter, J.R., Shlyaptsev, V.N.

Volltext

Simulating a Maxwellian plasma using an electron beam ion trap von Savin, D. W., Beiersdorfer, P., Kahn, S. M., Beck, B. R., Brown, G. V., Gu, M. F., Liedahl, D. A., Scofield, J. H.

Volltext

Reproducible technique for fabrication of thin films of high transition temperature superconductors von MANKIEWICH, P. M, SCOFIELD, J. H, SKOCPOL, W. J, HOWARD, R. E, DAYEM, A. H, GOOD, E

Volltext

Evidence that similar point defects cause 1/f noise and radiation-induced-hole trapping in metal-oxide-semiconductor transistors von FLEETWOOD, D. M, SCOFIELD, J. H

Volltext

X-ray attenuation cross sections for energies 100 eV to 100 keV and elements Z = 1 to Z = 92 von Saloman, E.B., Hubbell, J.H., Scofield, J.H.

Volltext

Demonstration of a soft X-ray amplifier von MATTHEWS, D. L, HAGELSTEIN, P. L, CAMPBELL, E. M, HATCHER, C. W, HAWRYLUK, A. M, KAUFFMAN, R. L, PLEASANCE, L. D, RAMBACH, G, SCOFIELD, J. H, STONE, G, WEAVER, T. A, ROSEN, M. D, ECKART, M. J, CEGLIO, N. M, HAZI, A. U, MEDECKI, H, MCGOWAN, B. J, TREBES, J. E, WHITTEN, B. L

Volltext