The Topografiner: An Instrument for Measuring Surface Microtopography von Young, Russell, Ward, John, Scire, Fredric

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Piezodriven 50‐μm range stage with subnanometer resolution von Scire, Fredric E., Teague, E. Clayton

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Three-dimensional stylus profilometry von Teague, E.Clayton, Scire, Fredric E., Baker, Saul M., Jensen, Stephen W.

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Para‐flex stage for microtopographic mapping von Teague, E. Clayton, Young, Russell D., Scire, Fredric, Gilsinn, David

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Planar biaxial micropositioning stage von SCIRE, FREDRIC E

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Sinusoidal profile precision roughness specimens von Teague, E.Clayton, Scire, Fredric E., Vorburger, Theodore V.

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Flexure hinge von SCIRE, FREDRIC E, TEAGUE, E. CLAYTON

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Precision reference specimens of surface roughness: Some characteristics of the cali-block von Young, Russell D., Scire, Fredric E.

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PLANAR BIAXIAL MICROPOSITIONING STAGE von SCIRE, FREDRIC E

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PLANAR BIAXIAL MICROPOSITIONING STAGE von SCIRE, FREDRIC, E

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