Current single event effects and radiation damage results for candidate spacecraft electronics von O'Bryan, M.V., LaBel, K.A., Ladbury, R.L., Poivey, C., Howard, J.W., Reed, R.A., Kniffin, S.D., Buchner, S.P., Bings, J.P., Titus, J.L., Clark, S.D., Turflinger, T.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., Forney, J.D., Jones, M.R., Sanders, A.B., Irwin, T.L., Cox, S.R., Kahric, Z.A., Palor, C.D., Sciarini, J.A.

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Total dose and single event effects testing of the Intel pentium III (P3) and AMD K7 microprocessors von Howard, J.W., Carts, M.A., Stattel, R., Rogers, C.E., Irwin, T.L., Dunsmore, C., Sciarini, J.A., LaBel, K.A.

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