The impact of nitrogen on the defect aggregation in silicon von von Ammon, W., Hölzl, R., Virbulis, J., Dornberger, E., Schmolke, R., Gräf, D.

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Measurements of atmospheric mercury with high time resolution: Recent applications in environmental research and monitoring von EBINGHAUS, R, KOCK, H. H, SCHMOLKE, S. R

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On the impact of nanotopography of silicon wafers on post-chemical mechanical polished oxide layers von SCHMOLKE, R, DETERS, R, THIEME, P, PECH, R, SCHWENK, H, DIAKOURAKIS, G

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A comprehensive Eulerian modelling framework for airborne mercury species: model development and applications in Europe von Petersen, G., Bloxam, R., Wong, S., Munthe, J., Krüger, O., Schmolke, S.R., Kumar, A.Vinod

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Simultaneous measurements of total gaseous mercury at four sites on a 800 km transect: spatial distribution and short-time variability of total gaseous mercury over central Europe von Schmolke, S.R., Schroeder, W.H., Kock, H.H., Schneeberger, D., Munthe, J., Ebinghaus, R.

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Characterization of crystal quality by crystal originated particle delineation and the impact on the silicon wafer surface von GRÄF, D, SUHREN, M, LAMBERT, U, SCHMOLKE, R, EHLERT, A, VON AMMON, W, WAGNER, P

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Characterization of silicon wafer back sides with low thermal oxide layers by copper deposition von SCHMOLKE, R, PUPPE, G, PIONTEK, H

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Erratum to “The impact of nitrogen on the defect aggregation in silicon”: [J. Crystal Growth 226 (2001) 19–30] von von Ammon, W., Hölzl, R., Virbulis, J., Dornberger, E., Schmolke, R., Gräf, D.

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Techniques for analysing nanotopography on polished silicon wafers von Müller, T., Kumpe, R., Gerber, H.A., Schmolke, R., Passek, F., Wagner, P.

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Photoelastic stress evaluation and defect monitoring in 300-mm-wafer manufacturing von Geiler, H.D, Wagner, M, Karge, H, Paulsen, M, Schmolke, R

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On the Mechanism of Defect Suppression in Nitrogen-Doped Silicon Single Crystals von Dornberger, E., Gräf, D., Schmolke, R., Hölzl, Robert, von Ammon, Wilfried, Virbulis, J.

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On the impact of nanotopography of silicon wafers on post-CMP oxide layers von Schmolke, R, Deters, R, Thieme, P, Pech, R, Schwenk, H, Diakourakis, G

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A comprehensive Eulerian modeling framework for airborne mercury species: comparison of model results with data from measurement campaigns in Europe von Schmolke, S.R., Petersen, G.

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Discrimination of particles and defects on silicon wafers von Passek, F, Schmolke, R, Piontek, H, Luger, A, Wagner, P

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Characterization of Interstitial-Related Bulk Defects in p- Silicon Substrates by Epitaxial Deposition von Angelberger, W., Schmolke, R., von Ammon, Wilfried, Bender, H.

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Infrared spectroscopic investigation of poly (vinylidene fluoride) in an electric field von Büchtemann, A., Schmolke, R.

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Multivariate statistical approach to the temporal and spatial patterns of selected bioindicators observed in the North Sea during the years 1995–1997 von Schmolke, S. R, Broeg, K, Zander, S, Bissinger, V, Hansen, P. D, Kress, N, Herut, B, Jantzen, E, Krüner, G, Sturm, A, Körting, W, von Westernhagen, H

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Impurity-related dynamical optical switching in CdS von Schmolke, R., Schöll, E., Nägele, M., Gutowski, J.

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A model for impurity-related optical bistability in II–VI semiconductors von Schmolke, R., Schöll, E., Gutowski, J.

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Nonlinear optical switching fronts in CdS von Schmolke, R., Schöll, E., Nägele, M., Gutowski, J.

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