The impact of system configuration on device radiation damage testing of optical components von Kniffan, S.D., Reed, R.A., Marshall, P.W., Howard, J.W., Kim, H.S., Schepis, J.P.

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In vivo distribution of cryogenically preserved guinea pig granulocytes von Lionetti, F.J., Hunt, S.M., Schepis, J.P., Roy, A.J., Liss, R.H., Valeri, C.R.

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The conversion of 17α-hydroxyprogesterone into pregn-4-en-3α,17α-diol-20-one and other substances by perfusions through bovine adrenals and ovaries von Levy, H, Saito, T, Takeyama, S, Merrill, A.P, Schepis, J.P, Porter, G, Fitts, M

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High-performance nMOSFET with in-situ phosphorus-doped embedded Si:C (ISPD eSi:C) source-drain stressor von Yang, B. Frank, Takalkar, R., Ren, Z., Black, L., Dube, A., Weijtmans, J.W., Li, J., Johnson, J.B., Faltermeier, J., Madan, A., Zhu, Z., Turansky, A., Xia, G., Chakravarti, A., Pal, R., Chan, K., Reznicek, A., Adam, T.N., Yang, B., de Souza, J.P., Harley, E.C.T., Greene, B., Gehring, A., Cai, M., Aime, D., Sun, S., Meer, H., Holt, J., Theodore, D., Zollner, S., Grudowski, P., Sadana, D., Park, D.-G., Mocuta, D., Schepis, D., Maciejewski, E., Luning, S., Pellerin, J., Leobandung, E.

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Novel Enhanced Stressor with Graded Embedded SiGe Source/Drain for High Performance CMOS Devices von Ieong, M., Sudijono, J., Ku, J.H., Shum, D., Hierlemann, M., Amos, R., Chiulli, G., Lindsay, R., Kim, S.D., Loesing, R., Burns, L., Turansky, A., Madan, A., St Lawrence, B., Davis, R., Murphy, R., Li, J., Li, J., Kim, J.J., Zhuang, H., Mishra, S., Schepis, D., Gutmann, A., Kempisty, J., Adam, T.N., Holt, J., Ng, H., Fang, S., Chong, Y.F., Stierstorfer, R., Krishnasamy, R., Luo, Z., Rovedo, N., Teo, L.W., Utomo, H., Han, J.P., Ieong, M.

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