Polarization in Cadmium Telluride Nuclear Radiation Detectors von Siffert, P., Berger, J., Scharager, C., Cornet, A., Stuck, R., Bell, R. O., Serreze, H. B., Wald, F. V.

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Performance Comparison of Standard CdTe and Hgl2 Detectors von Scharager, C., Siffert, P., Holtzer, A., Schieber, M.

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Defects in pure and halogen compensated cadmium telluride grown by the THM method von Stuck, R., Cornet, A., Scharager, C., Siffert, P.

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Characterization of germanium-doped CdTe crystals von Scharager, C., Siefert, P., Höschl, P., Moravec, P., Vaněček, M.

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Determination of deep levels in semi‐insulating cadmium telluride by thermally stimulated current measurements von Scharager, C., Muller, J. C., Stuck, R., Siffert, P.

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Correlation between Surface Properties and Detection Characteristics of Cadmium Telluride Detectors von Hage-Ali, M., Stuck, R., Scharager, C., Siffert, P.

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Study of trapping in mercuric iodide by thermally stimulated current measurements von Stuck, R., Muller, J. C., Ponpon, J. P., Scharager, C., Schwab, C., Siffert, P.

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Argon ion induced X-ray analysis of silicon and chlorine in cadmium telluride von Cailleret, J., Heitz, Ch, Lagarde, G., Scharager, C., Siffert, P., Tenorio, D.

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Deep level study in AgGaS2 by thermally stimulated current measurements von von Bardeleben, H. J., Schwab, C., Scharager, C., Muller, J. C., Siefert, P., Feigelson, R. S.

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Polarization-free semi-insulating chlorine doped cadmium telluride von Hage-Ali, M., Scharager, C., Koebel, J.M., Sifferi, P.

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Determination of deep levels in semi-insulating cadmium telluride by thermally stimulated current measurements von Scharager, C., Muller, J. C., Stuck, R., Siffert, P.

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Trace analysis in cadmium telluride by heavy ion induced x-ray emission and by SIMS von Scharager, C., Stuck, R., Siffert, P., Cailleret, J., Heitz, Ch, Lagarde, G., Tenorio, D.

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Performance comparison of standard CdTe and HgI$_2$ detectors von Scharager, C., Siffert, P., Holtzer, A., Schieber, M.

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Defects in pure and halogen compensated cadmium telluride grown by the THM method von Stuck, R., Cornet, A., Scharager, C., Siffert, P.

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Defects in Pure and Halogen-Compensated CdTe Grown by the THM (Travelling Heater) Method von Stuck, R, Cornet, A, Scharager, C, Siffert, P

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Deep level study in Ag Ga S$_2$ by thermally stimulated currents measurements von von Bardeleben, H.J., Schwab, C., Scharager, C., Muller, J.C., Siffert, P., Feigelson, R.S.

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CdTe-InSb heterojunctions von Rabin, B., Scharager, C., Hage-Ali, M., Siffert, P., Wald, F.V., Bell, R.O.

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Determination of Deep Levels in Semi-Insulating CdTe by Thermally Stimulated Current Measurements von Scharager, C, Muller, J C, Stuck, R, Siffert, P

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CdTe -- InSb Heterojunctions. An Investigation by Electrical Measurements and by Secondary Ion Mass Spectrometry von Rabin, B

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CdTe-InSb heterojunctions von Rabin, B., Scharager, C., Hage-ali, M., Siffert, P., Wald, F. V., Bell, R. O.

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