Understanding the growth mechanism of graphene on Ge/Si(001) surfaces von Dabrowski, J., Lippert, G., Avila, J., Baringhaus, J., Colambo, I., Dedkov, Yu S., Herziger, F., Lupina, G., Maultzsch, J., Schaffus, T., Schroeder, T., Kot, M., Tegenkamp, C., Vignaud, D., Asensio, M.-C.

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Influence of sample preparation on intrinsic stresses inside a model Chip - First results of partial decapsulation von Schaffus, T., Albert, P., Breuer, W., Debie, D., Graml, M., Hollerith, C., Kroninger, F., Mack, W., Pfaff, H., Schaffus, M., Walter, J.

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Direct growth of low-doped graphene on Ge/Si(001) surfaces von Dabrowski, J, Lippert, G, Avila, J, Baringhaus, J, Colambo, I, Dedkov, Yu S, Herziger, F, Lupina, G, Maultzsch, J, Schaffus, T, Schroeder, T, Sowinska, M, Tegenkamp, C, Vignaud, D, M -C Asensio

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Button shear testing for adhesion measurements of 2D materials von Schätz, Josef, Nayi, Navin, Weber, Jonas, Metzke, Christoph, Lukas, Sebastian, Walter, Jürgen, Schaffus, Tim, Streb, Fabian, Reato, Eros, Piacentini, Agata, Grundmann, Annika, Kalisch, Holger, Heuken, Michael, Vescan, Andrei, Pindl, Stephan, Lemme, Max C.

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Button Shear Testing for Adhesion Measurements of 2D Materials von Schätz, Josef, Nayi, Navin, Weber, Jonas, Metzke, Christoph, Lukas, Sebastian, Piacentini, Agata, Reato, Eros, Walter, Jürgen, Schaffus, Tim, Streb, Fabian, Grundmann, Annika, Kalisch, Holger, Heuken, Michael, Vescan, Andrei, Pindl, Stephan, Lemme, Max C

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Button Shear Testing for Adhesion Measurements of 2D Materials von Schätz, Josef, Nayi, Navin, Weber, Jonas, Metzke, Christoph, Lukas, Sebastian, Piacentini, Agata, Reato, Eros, Walter, Jürgen, Schaffus, Tim, Streb, Fabian, Grundmann, Annika, Kalisch, Holger, Heuken, Michael, Vescan, Andrei, Pindl, Stephan, Lemme, Max C

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