A new method for the determination of the wave aberration function for high resolution TEM: 1. Measurement of the symmetric aberrations von Meyer, R.R, Kirkland, A.I, Saxton, W.O

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A new method for the determination of the wave aberration function for high-resolution TEM.: 2. Measurement of the antisymmetric aberrations von Meyer, R.R., Kirkland, A.I., Saxton, W.O.

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What is the focus variation method? Is it new? Is it direct? von Saxton, W.O.

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Cation segregation in Nb16W18O94 using high angle annular dark field scanning transmission electron microscopy and image processing von Kirkland, A. I., Saxton, W. O.

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Three-dimensional structure of the regular surface layer (HPI layer) of Deinococcus radiodurans von Baumeister, W., Barth, M., Hegerl, R., Guckenberger, R., Hahn, M., Saxton, W.O.

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A new way of measuring microscope aberrations von Saxton, W.O

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Super-resolution by aperture synthesis: tilt series reconstruction in CTEM von Kirkland, A.I., Saxton, W.O., Chau, K.-L., Tsuno, K., Kawasaki, M.

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Three-dimensional structure of the tetragonal surface layer of Sporosarcina ureae von ENGELHARDT, H, OWEN SAXTON, W, BAUMEISTER, W

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Mass Mapping of a Protein Complex with the Scanning Transmission Electron Microscope von Engel, A., Baumeister, W., Saxton, W. O.

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From lattice distortion to molecular distortion: characterising and exploiting crystal deformation von Saxton, W.O., Dürr, R., Baumeister, W.

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Simple prescriptions for estimating three-fold astigmatism von Saxton, W.O

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Quantitative comparison of images and transforms von Saxton, W. O.

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Structure of a transition metal-containing polyyne von Dray, A. E, Rachel, R, Saxton, W. O, Lewis, J, Khan, M. S, Donald, A. M, Friend, R. H

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The importance of beam alignment and crystal tilt in high resolution electron microscopy von Smith, David J., Saxton, W.O., O'Keefe, M.A., Wood, G.J., Stobbs, W.M.

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Three-dimensional reconstruction of imperfect two-dimensional crystals von Saxton, W.O., Baumeister, W., Hahn, M.

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The regular surface layer of Acetogenium kivui: some structural, developmental and evolutionary aspects von Rasch, M., Saxton, W.O., Baumeister, W.

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Phase determination in bright-field electron microscopy using complementary half-plane apertures von Saxton, W O

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Beam damage in a transition-metal-containing poly-yne von Dray, A.E., Rachel, R., Saxton, W.O., Donald, A.M., Friend, R.H., Khan, M.S., Lewis, J.

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Sign conventions in electron diffraction and imaging von Saxton, W.O., O'Keefe, M.A., Cockayne, D.J.H., Wilkens, M.

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The Electrostatic Contribution to the Forward-Scattering Potential at a Space Charge Layer in High-Energy Electron Diffraction. II. Fringing Fields von Dunin-Borkowski, R. E., Saxton, W. O.

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