Steady-state junction current distribution in p-n GaN diodes measured using low-energy electron microscopy (LEEM) von Ho, Wan Ying, Johnson, Cameron W., Tak, Tanay, Sauty, Mylène, Chow, Yi Chao, Nakamura, Shuji, Schmid, Andreas, Peretti, Jacques, Weisbuch, Claude, Speck, James S.

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Localization Effect in Photoelectron Transport Induced by Alloy Disorder in Nitride Semiconductor Compounds von Sauty, Mylène, Lopes, Nicolas M. S., Banon, Jean-Philippe, Lassailly, Yves, Martinelli, Lucio, Alhassan, Abdullah, Chow, Yi Chao, Nakamura, Shuji, Speck, James S., Weisbuch, Claude, Peretti, Jacques

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Nanoscale Mapping of Sub‐Gap Electroluminescence from Step‐Bunched, Oxidized 4H‐SiC Surfaces von Alyabyeva, Natalia, Ding, Jacques, Sauty, Mylène, Woerle, Judith, Jousseaume, Yann, Ferro, Gabriel, McCallum, Jeffrey C., Peretti, Jacques, Johnson, Brett C., Rowe, Alistair C. H.

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Probing Local Emission Properties in InGaN/GaN Quantum Wells by Scanning Tunneling Luminescence Microscopy von Sauty, Mylène, Alyabyeva, Natalia, Lynsky, Cheyenne, Chow, Yi Chao, Nakamura, Shuji, Speck, James S., Lassailly, Yves, Rowe, Alistair C. H., Weisbuch, Claude, Peretti, Jacques

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Injection mechanisms in a III -nitride light-emitting diode as seen by self-emissive electron microscopy von Tak, Tanay, Johnson, Cameron W., Ho, Wan Ying, Wu, Feng, Sauty, Mylène, Rebollo, Steve, Schmid, Andreas K., Peretti, Jacques, Wu, Yuh-Renn, Weisbuch, Claude, Speck, James S.

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Study of the impact of alloy disorder on the electronic and optical properties of nitride semiconductor compounds and of their heterostructures von Sauty, Mylène

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Nanoscale Mapping of Sub‐Gap Electroluminescence from Step‐Bunched, Oxidized 4H‐SiC Surfaces von Alyabyeva, Natalia, Ding, Jacques, Sauty, Mylène, Woerle, Judith, Jousseaume, Yann, Ferro, Gabriel, McCallum, Jeffrey C., Peretti, Jacques, Johnson, Brett C., Rowe, Alistair C. H.

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Investigation of the cesium activation of Ga N photocathodes by low-energy electron microscopy von Sauty, Mylène, Johnson, Cameron W., Tak, Tanay, Ho, Wan Ying, Chow, Yi Chao, Speck, James S., Schmid, Andreas K., Weisbuch, Claude, Peretti, Jacques

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Nanoscale mapping of sub-gap electroluminescence from step-bunched, oxidized 4H-SiC surfaces von Alyabyeva, Natalia, Ding, Jacques, Sauty, Mylène, Woerle, Judith, Jousseaume, Yann, Ferro, Gabriel, McCallum, Jeffrey C, Peretti, Jacques, Johnson, Brett C, Rowe, Alistair C H

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Evidence of localization effect on photoelectron transport induced by alloy disorder in nitride semiconductor compounds von Sauty, Mylène, Lopes, Nicolas M S, Banon, Jean-Philippe, Lassailly, Yves, Martinelli, Lucio, Alhassan, Abdullah, Nakamura, Shuji, Speck, James S, Weisbuch, Claude, Peretti, Jacques

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Probing local emission properties in InGaN/GaN quantum wells by scanning tunneling luminescence microscopy von Sauty, Mylène, Alyabyeva, Natalia, Lynsky, Cheyenne, Yi Chao Chow, Nakamura, Shuji, Speck, James S, Lassailly, Yves, Rowe, Alistair C H, Weisbuch, Claude, Peretti, Jacques

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