Read-out of micromechanical cantilever sensors by phase shifting interferometry von Helm, M., Servant, J. J., Saurenbach, F., Berger, R.

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Imaging of ferroelectric domain walls by force microscopy von SAURENBACH, F, TERRIS, B. D

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Force microscopy of ion-containing polymer surfaces: morphology and charge structure von Saurenbach, F, Wollmann, D, Terris, B. D, Diaz, A. F

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Bridge configuration of piezoresistive devices for scanning force microscopes von Jumpertz, R., Schelten, J., Ohlsson, O., Saurenbach, F.

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Electrostatic writing and imaging using a force microscope von Saurenbach, F., Terris, B.D.

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Piezoresistive sensors on AFM cantilevers with atomic resolution von Jumpertz, R., Hart, A.v.d., Ohlsson, O., Saurenbach, F., Schelten, J.

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Layered magnetic structures: antiferromagnetic type interlayer coupling and magnetoresistance due to antiparallel alignment von Grünberg, P., Barnas, J., Saurenbach, F., Fuβ, J.a., Wolf, A., Vohl, M.

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Enhanced magnetoresistance in layered magnetic structures with antiferromagnetic interlayer exchange von Binasch, G, Grünberg, P, Saurenbach, F, Zinn, W

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Static and dynamic magnetic properties of Fe-Cr-layered structures with antiferromagnetic interlayer exchange von SAURENBACH, F, WALZ, U, HINCHEY, L, GRÜNBERG, P, ZINN, W

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Spin waves and magnetoresistance in exchange coupled layered magnetic structures von Saurenbach, F., Barnas´, J., Binasch, G., Vohl, M., Gru¨nberg, P., Zinn, W.

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Exchange coupling of ferromagnetic films across nonmagnetic interlayers von SWIATEK, P, SAURENBACH, F, PANG, Y, GRÜNBERG, P, ZINN, W

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Voltage contrast in integrated circuits with 100 nm spatial resolution by scanning force microscopy von Bohm, C, Saurenbach, F, Taschner, P, Roths, C, Kubalek, E

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Bridge configuration of piezoresistive devices for scanning force microscopes: Technical Digest for Transducers '97 von JUMPERTZ, R, SCHELTEN, J, OHLSSON, O, SAURENBACH, F

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Electrostatic writing and imaging using a force microscope von Saurenbach, F., Terris, B.D.

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Piezoresistive bridge configuration for atomic force microscopy von Jumpertz, R., van der Hart, A., Schelten, J., Ohlsson, O., Sulzbach, Th, Saurenbach, F.

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Static and Dynamic Magnetic Properties of Fe--Cr-Layered Structures With Antiferromagnetic Interlayer Exchange von Saurenbach, F, Walz, U, Hinchey, L, Grunberg, P, Zinn, W

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Exchange Coupling of Ferromagnetic Films Across Nonmagnetic Interlayers von Swiatek, P, Saurenbach, F, Pang, Y, Grunberg, P, Zinn, W

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Layered Magnetic Structures: Antiferromagnetic Type Interlayer Coupling and Magnetoresistance Due to Antiparallel Alignment von Grunberg, P, Barnas, J, Saurenbach, F, Fuss, J A, Wolf, A, Vohl, M

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