SIMS quantification of matrix and impurity species in Al x Ga 1− x N von Gu, C.J., Stevie, F.A., Hitzman, C.J., Saripalli, Y.N., Johnson, M., Griffis, D.P.

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SIMS quantification of matrix and impurity species in AlxGa1-xN von GU, C. J, STEVIE, F. A, HITZMAN, C. J, SARIPALLI, Y. N, JOHNSON, M, GRIFFIS, D. P

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Properties of III-N MOS structures with low-temperature epitaxially regrown ohmic contacts von Saripalli, Y.N., Zeng, C., Long, J.P., Barlage, D.W., Johnson, M.A.L., Braddock, D.

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